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Title: Phase Tomography Reconstructed by 3D TIE in Hard X-ray Microscope

Abstract

X-ray phase tomography and phase imaging are promising ways of investigation on low Z material. A polymer blend of PE/PS sample was used to test the 3D phase retrieval method in the parallel beam illuminated microscope. Because the polymer sample is thick, the phase retardation is quite mixed and the image can not be distinguished when the 2D transport intensity equation (TIE) is applied. In this study, we have provided a different approach for solving the phase in three dimensions for thick sample. Our method involves integration of 3D TIE/Fourier slice theorem for solving thick phase sample. In our experiment, eight sets of de-focal series image data sets were recorded covering the angular range of 0 to 180 degree. Only three set of image cubes were used in 3D TIE equation for solving the phase tomography. The phase contrast of the polymer blend in 3D is obviously enhanced, and the two different groups of polymer blend can be distinguished in the phase tomography.

Authors:
 [1];  [2];  [1];  [2];  [2]; ;  [3];  [4];  [1]
  1. National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan (China)
  2. (China)
  3. Department of material science and Engineering, Pohang University of Science and Technology, Pohang (Korea, Republic of)
  4. Institute of Physic, Academic Sinica, Taipei 115, Taiwan (China)
Publication Date:
OSTI Identifier:
21049283
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436320; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; HARD X RADIATION; IMAGE PROCESSING; IMAGES; MICROSCOPY; POLYMERS; TOMOGRAPHY; TRANSPORT THEORY

Citation Formats

Yin, G.-C., Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan, Chen, F.-R., Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan, Department of Eng. and System Science, National Tsing Hua University, Hsinchu 30076, Taiwan, Pyun, Ahram, Je, Jung Ho, Hwu, Yeukuang, and Liang, Keng S. Phase Tomography Reconstructed by 3D TIE in Hard X-ray Microscope. United States: N. p., 2007. Web. doi:10.1063/1.2436320.
Yin, G.-C., Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan, Chen, F.-R., Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan, Department of Eng. and System Science, National Tsing Hua University, Hsinchu 30076, Taiwan, Pyun, Ahram, Je, Jung Ho, Hwu, Yeukuang, & Liang, Keng S. Phase Tomography Reconstructed by 3D TIE in Hard X-ray Microscope. United States. doi:10.1063/1.2436320.
Yin, G.-C., Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan, Chen, F.-R., Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan, Department of Eng. and System Science, National Tsing Hua University, Hsinchu 30076, Taiwan, Pyun, Ahram, Je, Jung Ho, Hwu, Yeukuang, and Liang, Keng S. Fri . "Phase Tomography Reconstructed by 3D TIE in Hard X-ray Microscope". United States. doi:10.1063/1.2436320.
@article{osti_21049283,
title = {Phase Tomography Reconstructed by 3D TIE in Hard X-ray Microscope},
author = {Yin, G.-C. and Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan and Chen, F.-R. and Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan and Department of Eng. and System Science, National Tsing Hua University, Hsinchu 30076, Taiwan and Pyun, Ahram and Je, Jung Ho and Hwu, Yeukuang and Liang, Keng S.},
abstractNote = {X-ray phase tomography and phase imaging are promising ways of investigation on low Z material. A polymer blend of PE/PS sample was used to test the 3D phase retrieval method in the parallel beam illuminated microscope. Because the polymer sample is thick, the phase retardation is quite mixed and the image can not be distinguished when the 2D transport intensity equation (TIE) is applied. In this study, we have provided a different approach for solving the phase in three dimensions for thick sample. Our method involves integration of 3D TIE/Fourier slice theorem for solving thick phase sample. In our experiment, eight sets of de-focal series image data sets were recorded covering the angular range of 0 to 180 degree. Only three set of image cubes were used in 3D TIE equation for solving the phase tomography. The phase contrast of the polymer blend in 3D is obviously enhanced, and the two different groups of polymer blend can be distinguished in the phase tomography.},
doi = {10.1063/1.2436320},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}
  • X-ray tomography is widely used in materials science. However, X-ray scanners are often based on polychromatic radiation that creates artifacts such as dark streaks. We show this artifact is not always due to beam hardening. It may appear when scanning samples with high-Z elements inside a low-Z matrix because of the high-Z element absorption edge: X-rays whose energy is above this edge are strongly absorbed, violating the exponential decay assumption for reconstruction algorithms and generating dark streaks. A method is proposed to limit the absorption edge effect and is applied on a microelectronic case to suppress dark streaks between interconnections.
  • Quantitative phase retrieval with a sub-100-nm resolution is achieved from micrographs of a zone plate based transmission x-ray microscope. A plastic zone plate containing objects of sizes from micrometers down to tens of nanometers is used as a test sample to quantify the retrieved phase. Utilizing the focal serial images in the image plane, the phase information is retrieved quantitatively across the entire range of sizes by combining the transport intensity equation and self-consistent wave propagation methods in this partial coherence system. The study demonstrates a solution to overcome the deficiency encountered in the two phase retrieval approaches.
  • A Zernike-type phase contrast hard X-ray microscope was constructed at the Photon Factory BL3C2 (KEK). A white beam from a bending magnet was monochromatized by a silicon double crystal monochromator. Monochromatic parallel X-ray beam illuminated a sample, and transmitted and diffracted X-ray beams were imaged by a Fresnel zone plate (FZP) which had the outer zone width of 100 nm. A phase plate made of a thin aluminum foil with a pinhole was set at the back focal plane of the FZP. The phase plate modulated the diffraction beam from the FZP, whereas a direct beam passed through the pinhole.more » The resolution of the microscope was measured by observing a tantalum test pattern at an X-ray energy of 9 keV. A 100nm line-and-space pattern could be resolved. X-ray montage pictures of growing eggs of artemia (plankton) were obtained.« less
  • Quantitative phase tomography was evaluated by using a differential phase microscope with a Foucault knife-edge scanning filter. A 3D x-ray phase image of polystyrene beads was obtained at 5.4 keV. The reconstructed refractive index was fairly good agreement with the Henke’s tabulated data.