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Title: Phase Tomography Reconstructed by 3D TIE in Hard X-ray Microscope

Abstract

X-ray phase tomography and phase imaging are promising ways of investigation on low Z material. A polymer blend of PE/PS sample was used to test the 3D phase retrieval method in the parallel beam illuminated microscope. Because the polymer sample is thick, the phase retardation is quite mixed and the image can not be distinguished when the 2D transport intensity equation (TIE) is applied. In this study, we have provided a different approach for solving the phase in three dimensions for thick sample. Our method involves integration of 3D TIE/Fourier slice theorem for solving thick phase sample. In our experiment, eight sets of de-focal series image data sets were recorded covering the angular range of 0 to 180 degree. Only three set of image cubes were used in 3D TIE equation for solving the phase tomography. The phase contrast of the polymer blend in 3D is obviously enhanced, and the two different groups of polymer blend can be distinguished in the phase tomography.

Authors:
 [1];  [2];  [1];  [2];  [2]; ;  [3];  [4];  [1]
  1. National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan (China)
  2. (China)
  3. Department of material science and Engineering, Pohang University of Science and Technology, Pohang (Korea, Republic of)
  4. Institute of Physic, Academic Sinica, Taipei 115, Taiwan (China)
Publication Date:
OSTI Identifier:
21049283
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436320; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; HARD X RADIATION; IMAGE PROCESSING; IMAGES; MICROSCOPY; POLYMERS; TOMOGRAPHY; TRANSPORT THEORY

Citation Formats

Yin, G.-C., Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan, Chen, F.-R., Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan, Department of Eng. and System Science, National Tsing Hua University, Hsinchu 30076, Taiwan, Pyun, Ahram, Je, Jung Ho, Hwu, Yeukuang, and Liang, Keng S. Phase Tomography Reconstructed by 3D TIE in Hard X-ray Microscope. United States: N. p., 2007. Web. doi:10.1063/1.2436320.
Yin, G.-C., Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan, Chen, F.-R., Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan, Department of Eng. and System Science, National Tsing Hua University, Hsinchu 30076, Taiwan, Pyun, Ahram, Je, Jung Ho, Hwu, Yeukuang, & Liang, Keng S. Phase Tomography Reconstructed by 3D TIE in Hard X-ray Microscope. United States. doi:10.1063/1.2436320.
Yin, G.-C., Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan, Chen, F.-R., Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan, Department of Eng. and System Science, National Tsing Hua University, Hsinchu 30076, Taiwan, Pyun, Ahram, Je, Jung Ho, Hwu, Yeukuang, and Liang, Keng S. Fri . "Phase Tomography Reconstructed by 3D TIE in Hard X-ray Microscope". United States. doi:10.1063/1.2436320.
@article{osti_21049283,
title = {Phase Tomography Reconstructed by 3D TIE in Hard X-ray Microscope},
author = {Yin, G.-C. and Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan and Chen, F.-R. and Department of Photonics, National Chiao Tung University, Hsinchu 30076, Taiwan and Department of Eng. and System Science, National Tsing Hua University, Hsinchu 30076, Taiwan and Pyun, Ahram and Je, Jung Ho and Hwu, Yeukuang and Liang, Keng S.},
abstractNote = {X-ray phase tomography and phase imaging are promising ways of investigation on low Z material. A polymer blend of PE/PS sample was used to test the 3D phase retrieval method in the parallel beam illuminated microscope. Because the polymer sample is thick, the phase retardation is quite mixed and the image can not be distinguished when the 2D transport intensity equation (TIE) is applied. In this study, we have provided a different approach for solving the phase in three dimensions for thick sample. Our method involves integration of 3D TIE/Fourier slice theorem for solving thick phase sample. In our experiment, eight sets of de-focal series image data sets were recorded covering the angular range of 0 to 180 degree. Only three set of image cubes were used in 3D TIE equation for solving the phase tomography. The phase contrast of the polymer blend in 3D is obviously enhanced, and the two different groups of polymer blend can be distinguished in the phase tomography.},
doi = {10.1063/1.2436320},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}