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Title: Development and Trial Measurements of Hard X-ray Photoelectron Emission Microscope

Abstract

Photoelectron emission microscope (PEEM) study is performed using hard x-ray illumination. We have successfully obtained images with high spatial resolution of 40 nm with hard x-rays. Spectro-microscopy of Co micro-patterns on Si substrates, which can be applied to XAFS measurements on a minute scale by PEEM. Magnetic imaging has been demonstrated at the Pt L-edges on perpendicular magnetic recording pattern of CoCrPt alloy. These results are the first step toward a new spectroscopic microscopy and magnetic imaging in a hard x-ray region.

Authors:
;  [1]; ; ; ; ; ;  [2];  [3];  [4];  [5];  [6]
  1. Department of Applied Chemistry, University of Tokyo, Bunkyo-ku, Tokyo 113-8656 (Japan)
  2. JASRI/SPring-8, Koto, Hyogo, 679-5189 (Japan)
  3. Hiroshima Synchrotron Radiation Center (HiSOR), Higashi-hiroshima, Hiroshima 739-8526 (Japan)
  4. National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8562 (Japan)
  5. Research Institute of Electrical Communications (RIEC), Tohoku University, Sendai 980 (Japan)
  6. Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK), Tsukuba 305-0801 (Japan)
Publication Date:
OSTI Identifier:
21049277
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436315; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ABSORPTION SPECTROSCOPY; CHROMIUM; COBALT; EMISSION SPECTROSCOPY; FINE STRUCTURE; HARD X RADIATION; IMAGES; INTERMETALLIC COMPOUNDS; MAGNETISM; MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PLATINUM; SILICON; SPATIAL RESOLUTION; SUBSTRATES; X-RAY SPECTRA; X-RAY SPECTROSCOPY

Citation Formats

Taniuchi, T., Oshima, M., Wakita, T., Takagaki, M., Kawamura, N., Suzuki, M., Nakamura, T., Kobayashi, K., Kotsugi, M., Akinaga, H., Muraoka, H., and Ono, K.. Development and Trial Measurements of Hard X-ray Photoelectron Emission Microscope. United States: N. p., 2007. Web. doi:10.1063/1.2436315.
Taniuchi, T., Oshima, M., Wakita, T., Takagaki, M., Kawamura, N., Suzuki, M., Nakamura, T., Kobayashi, K., Kotsugi, M., Akinaga, H., Muraoka, H., & Ono, K.. Development and Trial Measurements of Hard X-ray Photoelectron Emission Microscope. United States. doi:10.1063/1.2436315.
Taniuchi, T., Oshima, M., Wakita, T., Takagaki, M., Kawamura, N., Suzuki, M., Nakamura, T., Kobayashi, K., Kotsugi, M., Akinaga, H., Muraoka, H., and Ono, K.. Fri . "Development and Trial Measurements of Hard X-ray Photoelectron Emission Microscope". United States. doi:10.1063/1.2436315.
@article{osti_21049277,
title = {Development and Trial Measurements of Hard X-ray Photoelectron Emission Microscope},
author = {Taniuchi, T. and Oshima, M. and Wakita, T. and Takagaki, M. and Kawamura, N. and Suzuki, M. and Nakamura, T. and Kobayashi, K. and Kotsugi, M. and Akinaga, H. and Muraoka, H. and Ono, K.},
abstractNote = {Photoelectron emission microscope (PEEM) study is performed using hard x-ray illumination. We have successfully obtained images with high spatial resolution of 40 nm with hard x-rays. Spectro-microscopy of Co micro-patterns on Si substrates, which can be applied to XAFS measurements on a minute scale by PEEM. Magnetic imaging has been demonstrated at the Pt L-edges on perpendicular magnetic recording pattern of CoCrPt alloy. These results are the first step toward a new spectroscopic microscopy and magnetic imaging in a hard x-ray region.},
doi = {10.1063/1.2436315},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}