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Title: A High Resolution Full Field Transmission X-ray Microscope at SSRL

Abstract

The Stanford Synchrotron Radiation Laboratory (SSRL) in collaboration with Xradia Inc., the NASA Ames Research Center and Cornell University is implementing a commercial hard x-ray full field imaging microscope based on zone plate optics on a wiggler beam line on SPEAR3. This facility will provide unprecedented analytical capabilities for a broad range of scientific areas and will enable research on nanoscale phenomena and structures in biology as well as materials science and environmental science. This instrument will provide high resolution x-ray microscopy, tomography, and spectromicroscopy capabilities in a photon energy range between 5-14 keV. The spatial resolution of the TXM microscope is specified as 20 nm exploiting imaging in third diffraction order. This imaging facility will optimally combine the latest imaging technology developed by Xradia Inc. with the wiggler source characteristics at beam line 6-2 at SSRL. This will result in an instrument capable of high speed and high resolution imaging with spectral tunability for spectromicroscopy, element specific and Zernike phase contrast imaging. Furthermore, a scanning microprobe capability will be integral to the system thus allowing elemental mapping and fluorescence yield XANES to be performed with a spatial resolution of about 1 {mu}m without introducing any changes to the opticalmore » configuration of the instrument.« less

Authors:
;  [1];  [2];  [3];  [4]
  1. Stanford Synchrotron Radiation Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94065 (United States)
  2. Xradia, Inc., 4075A Sprig Drive, Concord, CA 94520 (United States)
  3. NASA Ames Research Center, Moffett Field, CA 94035 (United States)
  4. Cornell University, 219 Upson Hall, Ithaca, NY 14853 (United States)
Publication Date:
OSTI Identifier:
21049272
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436310; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ABSORPTION SPECTROSCOPY; BEAM OPTICS; DIFFRACTION; FLUORESCENCE; HARD X RADIATION; KEV RANGE; MICROSCOPY; NANOSTRUCTURES; PLATES; SPATIAL RESOLUTION; SYNCHROTRON RADIATION; TOMOGRAPHY; TRANSMISSION; WIGGLER MAGNETS; X-RAY SPECTROSCOPY

Citation Formats

Luening, Katharina, Pianetta, Piero, Yun Wenbing, Almeida, Eduardo, and Meulen, Marjolein van der. A High Resolution Full Field Transmission X-ray Microscope at SSRL. United States: N. p., 2007. Web. doi:10.1063/1.2436310.
Luening, Katharina, Pianetta, Piero, Yun Wenbing, Almeida, Eduardo, & Meulen, Marjolein van der. A High Resolution Full Field Transmission X-ray Microscope at SSRL. United States. doi:10.1063/1.2436310.
Luening, Katharina, Pianetta, Piero, Yun Wenbing, Almeida, Eduardo, and Meulen, Marjolein van der. Fri . "A High Resolution Full Field Transmission X-ray Microscope at SSRL". United States. doi:10.1063/1.2436310.
@article{osti_21049272,
title = {A High Resolution Full Field Transmission X-ray Microscope at SSRL},
author = {Luening, Katharina and Pianetta, Piero and Yun Wenbing and Almeida, Eduardo and Meulen, Marjolein van der},
abstractNote = {The Stanford Synchrotron Radiation Laboratory (SSRL) in collaboration with Xradia Inc., the NASA Ames Research Center and Cornell University is implementing a commercial hard x-ray full field imaging microscope based on zone plate optics on a wiggler beam line on SPEAR3. This facility will provide unprecedented analytical capabilities for a broad range of scientific areas and will enable research on nanoscale phenomena and structures in biology as well as materials science and environmental science. This instrument will provide high resolution x-ray microscopy, tomography, and spectromicroscopy capabilities in a photon energy range between 5-14 keV. The spatial resolution of the TXM microscope is specified as 20 nm exploiting imaging in third diffraction order. This imaging facility will optimally combine the latest imaging technology developed by Xradia Inc. with the wiggler source characteristics at beam line 6-2 at SSRL. This will result in an instrument capable of high speed and high resolution imaging with spectral tunability for spectromicroscopy, element specific and Zernike phase contrast imaging. Furthermore, a scanning microprobe capability will be integral to the system thus allowing elemental mapping and fluorescence yield XANES to be performed with a spatial resolution of about 1 {mu}m without introducing any changes to the optical configuration of the instrument.},
doi = {10.1063/1.2436310},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}