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Title: Ray-Tracing Analysis of Fresnel-Zone-Plate Optical System as an Electron Beam Profile Monitor

Abstract

The analysis of the image distortion made by Fresnel-zone-plate optical system was studied with ray trace simulation and analytical treatment. The tolerable tilt angle depends on the tolerable image size. The distortion appears not only in image size but in image inclination. The simulation and the analysis performed for the optical parameters of the electron beam profile monitor may be useful for the advancement of the X-ray microscope performance.

Authors:
; ;  [1]; ;  [2]
  1. Synchrotron Radiation Laboratory, Institute for Solid State Physics, University of Tokyo, Kashiwanoha, 5-1-5, Kashiwa, Chiba, 277-8581 (Japan)
  2. High Energy Accelerator Research Organization (KEK), Oho 1-1, Tsukuba, Ibaraki (Japan)
Publication Date:
OSTI Identifier:
21049215
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436259; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; BEAM OPTICS; COMPUTERIZED SIMULATION; ELECTRON BEAMS; IMAGE PROCESSING; IMAGES; OPTICAL SYSTEMS; PERFORMANCE; PLATES; X RADIATION

Citation Formats

Fujisawa, Masami, Sakai, Hiroshi, Nakamura, Norio, Hayano, Hitoshi, and Muto, Toshiya. Ray-Tracing Analysis of Fresnel-Zone-Plate Optical System as an Electron Beam Profile Monitor. United States: N. p., 2007. Web. doi:10.1063/1.2436259.
Fujisawa, Masami, Sakai, Hiroshi, Nakamura, Norio, Hayano, Hitoshi, & Muto, Toshiya. Ray-Tracing Analysis of Fresnel-Zone-Plate Optical System as an Electron Beam Profile Monitor. United States. doi:10.1063/1.2436259.
Fujisawa, Masami, Sakai, Hiroshi, Nakamura, Norio, Hayano, Hitoshi, and Muto, Toshiya. Fri . "Ray-Tracing Analysis of Fresnel-Zone-Plate Optical System as an Electron Beam Profile Monitor". United States. doi:10.1063/1.2436259.
@article{osti_21049215,
title = {Ray-Tracing Analysis of Fresnel-Zone-Plate Optical System as an Electron Beam Profile Monitor},
author = {Fujisawa, Masami and Sakai, Hiroshi and Nakamura, Norio and Hayano, Hitoshi and Muto, Toshiya},
abstractNote = {The analysis of the image distortion made by Fresnel-zone-plate optical system was studied with ray trace simulation and analytical treatment. The tolerable tilt angle depends on the tolerable image size. The distortion appears not only in image size but in image inclination. The simulation and the analysis performed for the optical parameters of the electron beam profile monitor may be useful for the advancement of the X-ray microscope performance.},
doi = {10.1063/1.2436259},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}