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Title: Experimental measurement of multidimensional entanglement via equivalent symmetric projection

Abstract

We construct a linear optics measurement process to determine the entanglement measure, named I concurrence, of a set of 4x4-dimensional two-photon entangled pure states produced in the optical parametric down conversion process. In our experiment, an equivalent symmetric projection for the twofold copy of a single subsystem [presented by L. Aolita and F. Mintert, Phys. Rev. Lett. 97, 050501 (2006)] can be realized by observing the one-side two-photon coincidence without any triggering detection on the other subsystem. Here, for the first time, we realize the measurement for entanglement contained in biphoton pure states by taking advantage of the indistinguishability and the bunching effect of photons. Our method can determine the I concurrence of generic high-dimensional bipartite pure states produced in the parametric down conversion process.

Authors:
; ; ; ; ; ; ;  [1]
  1. Key Laboratory of Quantum Information, University of Science and Technology of China, CAS, Hefei, 230026 (China)
Publication Date:
OSTI Identifier:
21027965
Resource Type:
Journal Article
Journal Name:
Physical Review. A
Additional Journal Information:
Journal Volume: 76; Journal Issue: 5; Other Information: DOI: 10.1103/PhysRevA.76.052303; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1050-2947
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; MULTI-PHOTON PROCESSES; PHOTONS; POLARIZATION; PROJECTION OPERATORS; QUANTUM ENTANGLEMENT; QUANTUM MECHANICS; SYMMETRY

Citation Formats

Sun, F W, Cai, J M, Xu, J S, Chen, G, Liu, B H, Li, C F, Zhou, Z W, and Guo, G C. Experimental measurement of multidimensional entanglement via equivalent symmetric projection. United States: N. p., 2007. Web. doi:10.1103/PHYSREVA.76.052303.
Sun, F W, Cai, J M, Xu, J S, Chen, G, Liu, B H, Li, C F, Zhou, Z W, & Guo, G C. Experimental measurement of multidimensional entanglement via equivalent symmetric projection. United States. https://doi.org/10.1103/PHYSREVA.76.052303
Sun, F W, Cai, J M, Xu, J S, Chen, G, Liu, B H, Li, C F, Zhou, Z W, and Guo, G C. 2007. "Experimental measurement of multidimensional entanglement via equivalent symmetric projection". United States. https://doi.org/10.1103/PHYSREVA.76.052303.
@article{osti_21027965,
title = {Experimental measurement of multidimensional entanglement via equivalent symmetric projection},
author = {Sun, F W and Cai, J M and Xu, J S and Chen, G and Liu, B H and Li, C F and Zhou, Z W and Guo, G C},
abstractNote = {We construct a linear optics measurement process to determine the entanglement measure, named I concurrence, of a set of 4x4-dimensional two-photon entangled pure states produced in the optical parametric down conversion process. In our experiment, an equivalent symmetric projection for the twofold copy of a single subsystem [presented by L. Aolita and F. Mintert, Phys. Rev. Lett. 97, 050501 (2006)] can be realized by observing the one-side two-photon coincidence without any triggering detection on the other subsystem. Here, for the first time, we realize the measurement for entanglement contained in biphoton pure states by taking advantage of the indistinguishability and the bunching effect of photons. Our method can determine the I concurrence of generic high-dimensional bipartite pure states produced in the parametric down conversion process.},
doi = {10.1103/PHYSREVA.76.052303},
url = {https://www.osti.gov/biblio/21027965}, journal = {Physical Review. A},
issn = {1050-2947},
number = 5,
volume = 76,
place = {United States},
year = {Thu Nov 15 00:00:00 EST 2007},
month = {Thu Nov 15 00:00:00 EST 2007}
}