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Title: A cryogenic Quadraprobe scanning tunneling microscope system with fabrication capability for nanotransport research

Abstract

We describe the development and the capabilities of an advanced system for nanoscale electrical transport studies. This system consists of a low temperature four-probe scanning tunneling microscope (STM) and a high-resolution scanning electron microscope coupled to a molecular-beam epitaxy sample preparation chamber. The four STM probes can be manipulated independently with subnanometer precision, enabling atomic resolution STM imaging and four-point electrical transport study of surface electronic systems and nanostructured materials at temperatures down to 10 K. Additionally, an integrated energy analyzer allows for scanning Auger microscopy to probe chemical species of nanostructures. Some testing results are presented.

Authors:
; ; ; ; ;  [1]
  1. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)
Publication Date:
OSTI Identifier:
21024683
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 78; Journal Issue: 12; Other Information: DOI: 10.1063/1.2821610; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ACCURACY; CRYOGENICS; ELECTRIC CONDUCTIVITY; FABRICATION; IMAGES; MOLECULAR BEAM EPITAXY; NANOSTRUCTURES; PROBES; RESOLUTION; SAMPLE PREPARATION; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACES; TEMPERATURE RANGE 0065-0273 K; TESTING

Citation Formats

Kim, T -H, Zhouhang, Wang, Wendelken, John F, Weitering, Hanno H, Wenzhi, Li, Anping, Li, RHK Technology, Inc., Troy, Michigan 48083, Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996, Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996, Department of Physics, Florida International University, Miami, Florida 33199, and Center for Nonophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831. A cryogenic Quadraprobe scanning tunneling microscope system with fabrication capability for nanotransport research. United States: N. p., 2007. Web. doi:10.1063/1.2821610.
Kim, T -H, Zhouhang, Wang, Wendelken, John F, Weitering, Hanno H, Wenzhi, Li, Anping, Li, RHK Technology, Inc., Troy, Michigan 48083, Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996, Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996, Department of Physics, Florida International University, Miami, Florida 33199, & Center for Nonophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831. A cryogenic Quadraprobe scanning tunneling microscope system with fabrication capability for nanotransport research. United States. https://doi.org/10.1063/1.2821610
Kim, T -H, Zhouhang, Wang, Wendelken, John F, Weitering, Hanno H, Wenzhi, Li, Anping, Li, RHK Technology, Inc., Troy, Michigan 48083, Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996, Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996, Department of Physics, Florida International University, Miami, Florida 33199, and Center for Nonophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831. 2007. "A cryogenic Quadraprobe scanning tunneling microscope system with fabrication capability for nanotransport research". United States. https://doi.org/10.1063/1.2821610.
@article{osti_21024683,
title = {A cryogenic Quadraprobe scanning tunneling microscope system with fabrication capability for nanotransport research},
author = {Kim, T -H and Zhouhang, Wang and Wendelken, John F and Weitering, Hanno H and Wenzhi, Li and Anping, Li and RHK Technology, Inc., Troy, Michigan 48083 and Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996 and Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996 and Department of Physics, Florida International University, Miami, Florida 33199 and Center for Nonophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831},
abstractNote = {We describe the development and the capabilities of an advanced system for nanoscale electrical transport studies. This system consists of a low temperature four-probe scanning tunneling microscope (STM) and a high-resolution scanning electron microscope coupled to a molecular-beam epitaxy sample preparation chamber. The four STM probes can be manipulated independently with subnanometer precision, enabling atomic resolution STM imaging and four-point electrical transport study of surface electronic systems and nanostructured materials at temperatures down to 10 K. Additionally, an integrated energy analyzer allows for scanning Auger microscopy to probe chemical species of nanostructures. Some testing results are presented.},
doi = {10.1063/1.2821610},
url = {https://www.osti.gov/biblio/21024683}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 12,
volume = 78,
place = {United States},
year = {Sat Dec 15 00:00:00 EST 2007},
month = {Sat Dec 15 00:00:00 EST 2007}
}