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Title: Evidence for an Elongated (>60 Ion Skin Depths) Electron Diffusion Region during Fast Magnetic Reconnection

Abstract

Observations of an extremely elongated electron diffusion region occurring during fast reconnection are presented. Cluster spacecraft in situ observations of an expanding reconnection exhaust reveal a broad current layer ({approx}10 ion skin depths thick) supporting the reversal of the reconnecting magnetic field together with an intense current embedded at the center that is due to a super-Alfvenic electron outflow jet with transverse scale of {approx}9 electron skin depths. The electron jet extends at least 60 ion skin depths downstream from the X-line.

Authors:
; ;  [1];  [1];  [2]
  1. Space Sciences Laboratory, University of California, Berkeley, California 94720 (United States)
  2. Department of Physics and Astronomy, University of Delaware, Newark, Delaware 19716 (United States)
Publication Date:
OSTI Identifier:
21024618
Resource Type:
Journal Article
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 99; Journal Issue: 25; Other Information: DOI: 10.1103/PhysRevLett.99.255002; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0031-9007
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; DIFFUSION; ELECTRONS; IONS; MAGNETIC FIELDS; MAGNETIC RECONNECTION

Citation Formats

Phan, T D, Mozer, F S, Eastwood, J P, Drake, J F, University of Maryland, College Park, Maryland, 20742, and Shay, M A. Evidence for an Elongated (>60 Ion Skin Depths) Electron Diffusion Region during Fast Magnetic Reconnection. United States: N. p., 2007. Web. doi:10.1103/PHYSREVLETT.99.255002.
Phan, T D, Mozer, F S, Eastwood, J P, Drake, J F, University of Maryland, College Park, Maryland, 20742, & Shay, M A. Evidence for an Elongated (>60 Ion Skin Depths) Electron Diffusion Region during Fast Magnetic Reconnection. United States. doi:10.1103/PHYSREVLETT.99.255002.
Phan, T D, Mozer, F S, Eastwood, J P, Drake, J F, University of Maryland, College Park, Maryland, 20742, and Shay, M A. Fri . "Evidence for an Elongated (>60 Ion Skin Depths) Electron Diffusion Region during Fast Magnetic Reconnection". United States. doi:10.1103/PHYSREVLETT.99.255002.
@article{osti_21024618,
title = {Evidence for an Elongated (>60 Ion Skin Depths) Electron Diffusion Region during Fast Magnetic Reconnection},
author = {Phan, T D and Mozer, F S and Eastwood, J P and Drake, J F and University of Maryland, College Park, Maryland, 20742 and Shay, M A},
abstractNote = {Observations of an extremely elongated electron diffusion region occurring during fast reconnection are presented. Cluster spacecraft in situ observations of an expanding reconnection exhaust reveal a broad current layer ({approx}10 ion skin depths thick) supporting the reversal of the reconnecting magnetic field together with an intense current embedded at the center that is due to a super-Alfvenic electron outflow jet with transverse scale of {approx}9 electron skin depths. The electron jet extends at least 60 ion skin depths downstream from the X-line.},
doi = {10.1103/PHYSREVLETT.99.255002},
journal = {Physical Review Letters},
issn = {0031-9007},
number = 25,
volume = 99,
place = {United States},
year = {2007},
month = {12}
}