Ion beam capture and charge breeding in electron cyclotron resonance ion source plasmas

Journal Article · Mon Oct 15 00:00:00 EDT 2007 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2785844· OSTI ID:21024435

Kim, Jin-Soo; Zhao, L; Cluggish, B P; Pardo, Richard ^[1]

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1. FAR-TECH, Inc., San Diego, California 92121 (United States)

Beam capture of injected ions and charge breeding in electron cyclotron resonance (ECR) charge breeder ion source plasmas has been investigated utilizing an ECR plasma modeling code, the generalized ECR ion source model, and a Monte Carlo beam capture code. Beam capturing dynamics, charge breeding in the plasma, and the extracted charged ion states are described. Optimization of ion beam energy is performed for (1) high beam capture efficiency and (2) high charge state ion beam extractions. A sample case study for ANL-ECR has been performed. Ions entering ECR ion source plasma are slowed down mostly by the background ions. Assuming Maxwellian plasma ions, maximum beam energy loss occurs when the beam velocity is around the background thermal velocity in magnitude. It is also found that beam capture location affects charge state distribution. For instance, with a majority of beam ions captured near the middle of the device higher currents for higher charge states are obtained. The beam ions captured near the entry have a higher probability of backstreaming after they are captured. For this reason, the optimum beam energy of the injected Ar{sup +} beam ions for charge breeding is generally higher than the optimum input beam energy for maximum beam energy loss.

• OSTI ID: 21024435
• Journal Information: Review of Scientific Instruments, Vol. 78, Issue 10; Other Information: DOI: 10.1063/1.2785844; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
43 PARTICLE ACCELERATORS
ANL
ARGON IONS
BEAM-PLASMA SYSTEMS
BREEDING
CAPTURE
CHARGE STATES
CURRENTS
ECR ION SOURCES
EFFICIENCY
ELECTRON CYCLOTRON-RESONANCE
ENERGY LOSSES
EQUIPMENT
ION BEAMS
MONTE CARLO METHOD
OPTIMIZATION
PARTICLE BEAMS
PLASMA
PROBABILITY
SIMULATION