Methods for obtaining superresolution images in coherent x-ray diffraction microscopy

Journal Article · Sat Sep 15 00:00:00 EDT 2007 · Physical Review. A

DOI:https://doi.org/10.1103/PHYSREVA.76.033822· OSTI ID:21020592

Takahashi, Yukio; Nishino, Yoshinori; Ishikawa, Tetsuya ^[1]

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1. Frontier Research Base for Global Young Researchers, Frontier Research Center, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871 (Japan)

Coherent x-ray diffraction microscopy (CXDM) using an x-ray free electron laser (XFEL) is expected to open up a new frontier of structural studies in materials science and biology, while radiation damage of samples under the extremely intense x rays is a matter of considerable concern. Two superresolution methods for CXDM proposed in this paper offer solutions of the problems by numerical data analysis. Promising results for future applications of CXDM with XFEL were obtained in a numerical simulation.

• OSTI ID: 21020592
• Journal Information: Physical Review. A, Vol. 76, Issue 3; Other Information: DOI: 10.1103/PhysRevA.76.033822; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1050-2947
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COHERENT RADIATION
FREE ELECTRON LASERS
IMAGES
MATHEMATICAL SOLUTIONS
MICROSCOPY
RESOLUTION
SIMULATION
X RADIATION
X-RAY DIFFRACTION
X-RAY LASERS