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Title: Stress field induced by swift heavy ion irradiation in cubic yttria stabilized zirconia

Abstract

X-ray diffraction (XRD) was used to investigate the damage and the correlated stress induced by the slowing down of swift heavy ions in cubic zirconia polycrystals doped with 10 mol % Y{sub 2}O{sub 3}. Samples were irradiated at room temperature with 940 MeV Pb ions at fluences ranging from 5x10{sup 11} to 4x10{sup 13} cm{sup -2}. Changes of XRD profiles were examined at increasing fluences. Residual macroscopic stresses induced by irradiation were determined using XRD by the sin{sup 2} {psi} method. The state of stress in the irradiated layer was described by a combination of: (i) a hydrostatic stress caused by the formation of damaged tracks leading to swelling and (ii) a biaxial stress imposed by the bulk undamaged material, which controls the lateral expansion of the surface damaged layer. The evolution of the stress as a function of irradiation fluence was also determined: the intensity of the hydrostatic stress increases from 80 to 460 MPa when the fluence is increased from 5x10{sup 11} to 4x10{sup 13} cm{sup -2} and that of the biaxial stress increases correlatively from -80 to -1630 MPa.

Authors:
; ; ; ;  [1];  [2]
  1. Universite Paris Sud, LEMHE/ICMMO, UMR 8182, Batiment 410, 91405 Orsay (France)
  2. (France)
Publication Date:
OSTI Identifier:
20982887
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 101; Journal Issue: 10; Other Information: DOI: 10.1063/1.2733745; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; DOPED MATERIALS; HEAVY IONS; ION BEAMS; IRRADIATION; LAYERS; LEAD IONS; MEV RANGE 100-1000; PARTICLE TRACKS; POLYCRYSTALS; PRESSURE DEPENDENCE; PRESSURE RANGE MEGA PA 10-100; PRESSURE RANGE MEGA PA 100-1000; RESIDUAL STRESSES; SLOWING-DOWN; SWELLING; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; X-RAY DIFFRACTION; YTTRIUM OXIDES; ZIRCONIUM OXIDES

Citation Formats

Sattonnay, G., Lahrichi, M., Herbst-Ghysel, M., Garrido, F., Thome, L., and Centre de Spectrometrie Nucleaire et de Spectrometrie de Masse, CNRS-IN2P3-Universite Paris Sud, Batiment 108, 91405 Orsay. Stress field induced by swift heavy ion irradiation in cubic yttria stabilized zirconia. United States: N. p., 2007. Web. doi:10.1063/1.2733745.
Sattonnay, G., Lahrichi, M., Herbst-Ghysel, M., Garrido, F., Thome, L., & Centre de Spectrometrie Nucleaire et de Spectrometrie de Masse, CNRS-IN2P3-Universite Paris Sud, Batiment 108, 91405 Orsay. Stress field induced by swift heavy ion irradiation in cubic yttria stabilized zirconia. United States. doi:10.1063/1.2733745.
Sattonnay, G., Lahrichi, M., Herbst-Ghysel, M., Garrido, F., Thome, L., and Centre de Spectrometrie Nucleaire et de Spectrometrie de Masse, CNRS-IN2P3-Universite Paris Sud, Batiment 108, 91405 Orsay. Tue . "Stress field induced by swift heavy ion irradiation in cubic yttria stabilized zirconia". United States. doi:10.1063/1.2733745.
@article{osti_20982887,
title = {Stress field induced by swift heavy ion irradiation in cubic yttria stabilized zirconia},
author = {Sattonnay, G. and Lahrichi, M. and Herbst-Ghysel, M. and Garrido, F. and Thome, L. and Centre de Spectrometrie Nucleaire et de Spectrometrie de Masse, CNRS-IN2P3-Universite Paris Sud, Batiment 108, 91405 Orsay},
abstractNote = {X-ray diffraction (XRD) was used to investigate the damage and the correlated stress induced by the slowing down of swift heavy ions in cubic zirconia polycrystals doped with 10 mol % Y{sub 2}O{sub 3}. Samples were irradiated at room temperature with 940 MeV Pb ions at fluences ranging from 5x10{sup 11} to 4x10{sup 13} cm{sup -2}. Changes of XRD profiles were examined at increasing fluences. Residual macroscopic stresses induced by irradiation were determined using XRD by the sin{sup 2} {psi} method. The state of stress in the irradiated layer was described by a combination of: (i) a hydrostatic stress caused by the formation of damaged tracks leading to swelling and (ii) a biaxial stress imposed by the bulk undamaged material, which controls the lateral expansion of the surface damaged layer. The evolution of the stress as a function of irradiation fluence was also determined: the intensity of the hydrostatic stress increases from 80 to 460 MPa when the fluence is increased from 5x10{sup 11} to 4x10{sup 13} cm{sup -2} and that of the biaxial stress increases correlatively from -80 to -1630 MPa.},
doi = {10.1063/1.2733745},
journal = {Journal of Applied Physics},
number = 10,
volume = 101,
place = {United States},
year = {Tue May 15 00:00:00 EDT 2007},
month = {Tue May 15 00:00:00 EDT 2007}
}