Stress field induced by swift heavy ion irradiation in cubic yttria stabilized zirconia

Journal Article · Tue May 15 00:00:00 EDT 2007 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.2733745· OSTI ID:20982887

Sattonnay, G; Lahrichi, M; Herbst-Ghysel, M; Garrido, F; Thome, L ^[1]

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1. Universite Paris Sud, LEMHE/ICMMO, UMR 8182, Batiment 410, 91405 Orsay (France)

X-ray diffraction (XRD) was used to investigate the damage and the correlated stress induced by the slowing down of swift heavy ions in cubic zirconia polycrystals doped with 10 mol % Y{sub 2}O{sub 3}. Samples were irradiated at room temperature with 940 MeV Pb ions at fluences ranging from 5x10{sup 11} to 4x10{sup 13} cm{sup -2}. Changes of XRD profiles were examined at increasing fluences. Residual macroscopic stresses induced by irradiation were determined using XRD by the sin{sup 2} {psi} method. The state of stress in the irradiated layer was described by a combination of: (i) a hydrostatic stress caused by the formation of damaged tracks leading to swelling and (ii) a biaxial stress imposed by the bulk undamaged material, which controls the lateral expansion of the surface damaged layer. The evolution of the stress as a function of irradiation fluence was also determined: the intensity of the hydrostatic stress increases from 80 to 460 MPa when the fluence is increased from 5x10{sup 11} to 4x10{sup 13} cm{sup -2} and that of the biaxial stress increases correlatively from -80 to -1630 MPa.

• OSTI ID: 20982887
• Journal Information: Journal of Applied Physics, Vol. 101, Issue 10; Other Information: DOI: 10.1063/1.2733745; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DOPED MATERIALS
HEAVY IONS
ION BEAMS
IRRADIATION
LAYERS
LEAD IONS
MEV RANGE 100-1000
PARTICLE TRACKS
POLYCRYSTALS
PRESSURE DEPENDENCE
PRESSURE RANGE MEGA PA 10-100
PRESSURE RANGE MEGA PA 100-1000
RESIDUAL STRESSES
SLOWING-DOWN
SWELLING
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0273-0400 K
X-RAY DIFFRACTION
YTTRIUM OXIDES
ZIRCONIUM OXIDES