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Title: Barkhausen noise in variable thickness amorphous finemet films

Abstract

We measured the statistical properties of Barkhausen noise in finemet films with nominal composition Fe{sub 73.5}Cu{sub 1}Nb{sub 3}Si{sub 22.5}B{sub 4} and variable thickness between 25 and 1000 nm. Films have been sputtered on glass substrates and their structure is amorphous. The critical exponents of the power-law distributions for the jumps amplitude show a remarkable stability over the whole thickness range, whereas the other macroscopic magnetic properties undergo strong variations. The value of the critical exponent is about 0.8 between 50 and 500 nm with a small increase up to 1.0 at 1000 nm. These values are similar to those observed with the same experimental technique in other two-dimensional (2D) systems, but definitely smaller with respect to the values observed in truly three-dimensional (3D) systems. Our data therefore indicate that, in the investigated thickness range, the behavior remains typical of 2D systems. The small increase of the critical exponent at 1000 nm might be an indication of a starting transition toward a 3D behavior.

Authors:
; ;  [1]
  1. Dipartimento di Fisica, Politecnico di Milano, Piazza Leonardo da Vinci, 32, I-20132 Milano (Italy)
Publication Date:
OSTI Identifier:
20982764
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 101; Journal Issue: 6; Other Information: DOI: 10.1063/1.2711399; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BORON ALLOYS; COPPER ALLOYS; DEPOSITION; FERROMAGNETIC MATERIALS; GLASS; IRON ALLOYS; MAGNETIC PROPERTIES; NIOBIUM ALLOYS; SILICON ALLOYS; SUBSTRATES; THICKNESS; THIN FILMS; THREE-DIMENSIONAL CALCULATIONS; TWO-DIMENSIONAL CALCULATIONS

Citation Formats

Puppin, Ezio, Pinotti, Ermanno, and Brenna, Massimiliano. Barkhausen noise in variable thickness amorphous finemet films. United States: N. p., 2007. Web. doi:10.1063/1.2711399.
Puppin, Ezio, Pinotti, Ermanno, & Brenna, Massimiliano. Barkhausen noise in variable thickness amorphous finemet films. United States. doi:10.1063/1.2711399.
Puppin, Ezio, Pinotti, Ermanno, and Brenna, Massimiliano. Thu . "Barkhausen noise in variable thickness amorphous finemet films". United States. doi:10.1063/1.2711399.
@article{osti_20982764,
title = {Barkhausen noise in variable thickness amorphous finemet films},
author = {Puppin, Ezio and Pinotti, Ermanno and Brenna, Massimiliano},
abstractNote = {We measured the statistical properties of Barkhausen noise in finemet films with nominal composition Fe{sub 73.5}Cu{sub 1}Nb{sub 3}Si{sub 22.5}B{sub 4} and variable thickness between 25 and 1000 nm. Films have been sputtered on glass substrates and their structure is amorphous. The critical exponents of the power-law distributions for the jumps amplitude show a remarkable stability over the whole thickness range, whereas the other macroscopic magnetic properties undergo strong variations. The value of the critical exponent is about 0.8 between 50 and 500 nm with a small increase up to 1.0 at 1000 nm. These values are similar to those observed with the same experimental technique in other two-dimensional (2D) systems, but definitely smaller with respect to the values observed in truly three-dimensional (3D) systems. Our data therefore indicate that, in the investigated thickness range, the behavior remains typical of 2D systems. The small increase of the critical exponent at 1000 nm might be an indication of a starting transition toward a 3D behavior.},
doi = {10.1063/1.2711399},
journal = {Journal of Applied Physics},
number = 6,
volume = 101,
place = {United States},
year = {Thu Mar 15 00:00:00 EDT 2007},
month = {Thu Mar 15 00:00:00 EDT 2007}
}