Extreme-ultraviolet spectroscopy of highly charged xenon ions created using an electron-beam ion trap
- School of Physics, University College Dublin, Belfield, Dublin 4 (Ireland)
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
Extreme-ultraviolet spectra of xenon ions have been recorded in the 4.5 to 20 nm wavelength region using an electron beam ion trap and a flat field spectrometer. The electron beam energy was varied from 180 eV to 8 keV and radiation from charge states Xe{sup 6+} to Xe{sup 43+} was observed. Our measured wavelengths were compared to atomic structure calculations using the Cowan suite of codes. We have measured seventeen previously unreported features corresponding to transitions in Xe{sup 35+} through to Xe{sup 41+} with estimated wavelength uncertainties of {+-}0.003 nm. It was found that for the case of continuous injection of neutral xenon gas a wide range of charge states were always present in the trap but this charge state distribution was greatly narrowed, towards higher charge states, if a sufficiently low gas injection pressure was employed. The energy dependence of spectral lines arising from Xe{sup 42+} and Xe{sup 43+} revealed enhancement of the total ionization cross sections, due to excitation-autoionization of n=2 electrons to n=3 levels, in the Xe{sup 41+} and Xe{sup 42+} charge states.
- OSTI ID:
- 20982317
- Journal Information:
- Physical Review. A, Vol. 75, Issue 3; Other Information: DOI: 10.1103/PhysRevA.75.032520; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1050-2947
- Country of Publication:
- United States
- Language:
- English
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