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Title: Extreme-ultraviolet spectroscopy of highly charged xenon ions created using an electron-beam ion trap

Abstract

Extreme-ultraviolet spectra of xenon ions have been recorded in the 4.5 to 20 nm wavelength region using an electron beam ion trap and a flat field spectrometer. The electron beam energy was varied from 180 eV to 8 keV and radiation from charge states Xe{sup 6+} to Xe{sup 43+} was observed. Our measured wavelengths were compared to atomic structure calculations using the Cowan suite of codes. We have measured seventeen previously unreported features corresponding to transitions in Xe{sup 35+} through to Xe{sup 41+} with estimated wavelength uncertainties of {+-}0.003 nm. It was found that for the case of continuous injection of neutral xenon gas a wide range of charge states were always present in the trap but this charge state distribution was greatly narrowed, towards higher charge states, if a sufficiently low gas injection pressure was employed. The energy dependence of spectral lines arising from Xe{sup 42+} and Xe{sup 43+} revealed enhancement of the total ionization cross sections, due to excitation-autoionization of n=2 electrons to n=3 levels, in the Xe{sup 41+} and Xe{sup 42+} charge states.

Authors:
; ;  [1]; ; ; ;  [2]
  1. School of Physics, University College Dublin, Belfield, Dublin 4 (Ireland)
  2. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
Publication Date:
OSTI Identifier:
20982317
Resource Type:
Journal Article
Resource Relation:
Journal Name: Physical Review. A; Journal Volume: 75; Journal Issue: 3; Other Information: DOI: 10.1103/PhysRevA.75.032520; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; AUTOIONIZATION; CATIONS; CHARGE STATES; CROSS SECTIONS; ELECTRON BEAMS; ELECTRONS; ENERGY DEPENDENCE; EV RANGE 100-1000; EXCITATION; EXTREME ULTRAVIOLET SPECTRA; GAS INJECTION; INJECTION; KEV RANGE 01-10; MULTICHARGED IONS; SPECTROSCOPY; TRAPS; WAVELENGTHS; XENON; XENON IONS

Citation Formats

Fahy, K., Sokell, E., O'Sullivan, G., Aguilar, A., Pomeroy, J. M., Tan, J. N., and Gillaspy, J. D.. Extreme-ultraviolet spectroscopy of highly charged xenon ions created using an electron-beam ion trap. United States: N. p., 2007. Web. doi:10.1103/PHYSREVA.75.032520.
Fahy, K., Sokell, E., O'Sullivan, G., Aguilar, A., Pomeroy, J. M., Tan, J. N., & Gillaspy, J. D.. Extreme-ultraviolet spectroscopy of highly charged xenon ions created using an electron-beam ion trap. United States. doi:10.1103/PHYSREVA.75.032520.
Fahy, K., Sokell, E., O'Sullivan, G., Aguilar, A., Pomeroy, J. M., Tan, J. N., and Gillaspy, J. D.. Thu . "Extreme-ultraviolet spectroscopy of highly charged xenon ions created using an electron-beam ion trap". United States. doi:10.1103/PHYSREVA.75.032520.
@article{osti_20982317,
title = {Extreme-ultraviolet spectroscopy of highly charged xenon ions created using an electron-beam ion trap},
author = {Fahy, K. and Sokell, E. and O'Sullivan, G. and Aguilar, A. and Pomeroy, J. M. and Tan, J. N. and Gillaspy, J. D.},
abstractNote = {Extreme-ultraviolet spectra of xenon ions have been recorded in the 4.5 to 20 nm wavelength region using an electron beam ion trap and a flat field spectrometer. The electron beam energy was varied from 180 eV to 8 keV and radiation from charge states Xe{sup 6+} to Xe{sup 43+} was observed. Our measured wavelengths were compared to atomic structure calculations using the Cowan suite of codes. We have measured seventeen previously unreported features corresponding to transitions in Xe{sup 35+} through to Xe{sup 41+} with estimated wavelength uncertainties of {+-}0.003 nm. It was found that for the case of continuous injection of neutral xenon gas a wide range of charge states were always present in the trap but this charge state distribution was greatly narrowed, towards higher charge states, if a sufficiently low gas injection pressure was employed. The energy dependence of spectral lines arising from Xe{sup 42+} and Xe{sup 43+} revealed enhancement of the total ionization cross sections, due to excitation-autoionization of n=2 electrons to n=3 levels, in the Xe{sup 41+} and Xe{sup 42+} charge states.},
doi = {10.1103/PHYSREVA.75.032520},
journal = {Physical Review. A},
number = 3,
volume = 75,
place = {United States},
year = {Thu Mar 15 00:00:00 EDT 2007},
month = {Thu Mar 15 00:00:00 EDT 2007}
}