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Title: High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source

Abstract

Differential x-ray phase contrast imaging using a grating interferometer was combined with a magnifying cone beam geometry using a conventional microfocus x-ray tube. This brings the advantages of a magnifying cone beam setup, namely, a high spatial resolution in the micron range and the possibility of using an efficient, low resolution detector, into differential phase contrast imaging. The authors present methodical investigations which show how the primary measurement signal depends on the magnification factor. As an illustration of the potential of this quantitative imaging technique, a high-resolution x-ray phase contrast tomography of an insect is presented.

Authors:
; ; ; ; ; ;  [1];  [2];  [3]
  1. Siemens AG, Corporate Technology, 81739 Munich, Germany and Physik Department, Technische Universitaet Muenchen, 85747 Garching (Germany)
  2. (Germany)
  3. (Switzerland)
Publication Date:
OSTI Identifier:
20971949
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 90; Journal Issue: 22; Other Information: DOI: 10.1063/1.2743928; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; COMPUTERIZED TOMOGRAPHY; DIFFRACTION GRATINGS; INSECTS; INTERFEROMETERS; SPATIAL RESOLUTION; X RADIATION; X-RAY SOURCES; X-RAY TUBES

Citation Formats

Engelhardt, Martin, Baumann, Joachim, Schuster, Manfred, Kottler, Christian, Pfeiffer, Franz, Bunk, Oliver, David, Christian, Siemens AG, Corporate Technology, 81739 Munich, and Paul Scherrer Institut, 5232 Villigen PSI. High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source. United States: N. p., 2007. Web. doi:10.1063/1.2743928.
Engelhardt, Martin, Baumann, Joachim, Schuster, Manfred, Kottler, Christian, Pfeiffer, Franz, Bunk, Oliver, David, Christian, Siemens AG, Corporate Technology, 81739 Munich, & Paul Scherrer Institut, 5232 Villigen PSI. High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source. United States. doi:10.1063/1.2743928.
Engelhardt, Martin, Baumann, Joachim, Schuster, Manfred, Kottler, Christian, Pfeiffer, Franz, Bunk, Oliver, David, Christian, Siemens AG, Corporate Technology, 81739 Munich, and Paul Scherrer Institut, 5232 Villigen PSI. Mon . "High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source". United States. doi:10.1063/1.2743928.
@article{osti_20971949,
title = {High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source},
author = {Engelhardt, Martin and Baumann, Joachim and Schuster, Manfred and Kottler, Christian and Pfeiffer, Franz and Bunk, Oliver and David, Christian and Siemens AG, Corporate Technology, 81739 Munich and Paul Scherrer Institut, 5232 Villigen PSI},
abstractNote = {Differential x-ray phase contrast imaging using a grating interferometer was combined with a magnifying cone beam geometry using a conventional microfocus x-ray tube. This brings the advantages of a magnifying cone beam setup, namely, a high spatial resolution in the micron range and the possibility of using an efficient, low resolution detector, into differential phase contrast imaging. The authors present methodical investigations which show how the primary measurement signal depends on the magnification factor. As an illustration of the potential of this quantitative imaging technique, a high-resolution x-ray phase contrast tomography of an insect is presented.},
doi = {10.1063/1.2743928},
journal = {Applied Physics Letters},
number = 22,
volume = 90,
place = {United States},
year = {Mon May 28 00:00:00 EDT 2007},
month = {Mon May 28 00:00:00 EDT 2007}
}