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Title: Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength

Abstract

Samples of B{sub 4}C, amorphous C, chemical-vapor-deposition-diamond C, Si, and SiC were exposed to single 25 fs long pulses of 32.5 nm free-electron-laser radiation at fluences of up to 2.2 J/cm{sup 2}. The samples were chosen as candidate materials for x-ray free-electron-laser optics. It was found that the threshold for surface damage is on the order of the fluence required for thermal melting. For larger fluences, the crater depths correspond to temperatures on the order of the critical temperature, suggesting that the craters are formed by two-phase vaporization.

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ;  [1] more »;  [2];  [3];  [3];  [4];  [5];  [4];  [6] « less
  1. Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)
  2. (Poland)
  3. (Czech Republic)
  4. (Germany)
  5. (Sweden)
  6. (Germany) (and others)
Publication Date:
OSTI Identifier:
20971885
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 90; Journal Issue: 17; Other Information: DOI: 10.1063/1.2734366; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; AMORPHOUS STATE; BORON CARBIDES; CHEMICAL VAPOR DEPOSITION; CRITICAL TEMPERATURE; DAMAGE; DIAMONDS; EVAPORATION; FREE ELECTRON LASERS; MELTING; SILICON; SILICON CARBIDES; X-RAY LASERS

Citation Formats

Hau-Riege, S. P., London, R. A., Bionta, R. M., McKernan, M. A., Baker, S. L., Krzywinski, J., Sobierajski, R., Nietubyc, R., Pelka, J. B., Jurek, M., Juha, L., Chalupsky, J., Cihelka, J., Hajkova, V., Velyhan, A., Krasa, J., Kuba, J., Tiedtke, K., Toleikis, S., Tschentscher, Th., Institute of Physics PAS, Al. Lotnikow 32/46, PL-02-668 Warsaw, Institute of Physics AS CR, Na Slovance 2, 182 21 Prague 8, Czech Technical University, Zikova 4, 166 36 Prague, HASYLAB/DESY, Notkestrasse 85, D-22603 Hamburg, Department of Cell and Molecular Biology, Biomedical Centre, Box 596, Uppsala University, SE-75124 Uppsala, Institut fuer Experimentelle Physik, Universitaet Duisburg-Essen, 47048 Duisburg, and Institut fuer Optik und Quantenelektronik, Universitaet Jena, 07793 Jena. Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength. United States: N. p., 2007. Web. doi:10.1063/1.2734366.
Hau-Riege, S. P., London, R. A., Bionta, R. M., McKernan, M. A., Baker, S. L., Krzywinski, J., Sobierajski, R., Nietubyc, R., Pelka, J. B., Jurek, M., Juha, L., Chalupsky, J., Cihelka, J., Hajkova, V., Velyhan, A., Krasa, J., Kuba, J., Tiedtke, K., Toleikis, S., Tschentscher, Th., Institute of Physics PAS, Al. Lotnikow 32/46, PL-02-668 Warsaw, Institute of Physics AS CR, Na Slovance 2, 182 21 Prague 8, Czech Technical University, Zikova 4, 166 36 Prague, HASYLAB/DESY, Notkestrasse 85, D-22603 Hamburg, Department of Cell and Molecular Biology, Biomedical Centre, Box 596, Uppsala University, SE-75124 Uppsala, Institut fuer Experimentelle Physik, Universitaet Duisburg-Essen, 47048 Duisburg, & Institut fuer Optik und Quantenelektronik, Universitaet Jena, 07793 Jena. Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength. United States. doi:10.1063/1.2734366.
Hau-Riege, S. P., London, R. A., Bionta, R. M., McKernan, M. A., Baker, S. L., Krzywinski, J., Sobierajski, R., Nietubyc, R., Pelka, J. B., Jurek, M., Juha, L., Chalupsky, J., Cihelka, J., Hajkova, V., Velyhan, A., Krasa, J., Kuba, J., Tiedtke, K., Toleikis, S., Tschentscher, Th., Institute of Physics PAS, Al. Lotnikow 32/46, PL-02-668 Warsaw, Institute of Physics AS CR, Na Slovance 2, 182 21 Prague 8, Czech Technical University, Zikova 4, 166 36 Prague, HASYLAB/DESY, Notkestrasse 85, D-22603 Hamburg, Department of Cell and Molecular Biology, Biomedical Centre, Box 596, Uppsala University, SE-75124 Uppsala, Institut fuer Experimentelle Physik, Universitaet Duisburg-Essen, 47048 Duisburg, and Institut fuer Optik und Quantenelektronik, Universitaet Jena, 07793 Jena. Mon . "Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength". United States. doi:10.1063/1.2734366.
@article{osti_20971885,
title = {Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength},
author = {Hau-Riege, S. P. and London, R. A. and Bionta, R. M. and McKernan, M. A. and Baker, S. L. and Krzywinski, J. and Sobierajski, R. and Nietubyc, R. and Pelka, J. B. and Jurek, M. and Juha, L. and Chalupsky, J. and Cihelka, J. and Hajkova, V. and Velyhan, A. and Krasa, J. and Kuba, J. and Tiedtke, K. and Toleikis, S. and Tschentscher, Th. and Institute of Physics PAS, Al. Lotnikow 32/46, PL-02-668 Warsaw and Institute of Physics AS CR, Na Slovance 2, 182 21 Prague 8 and Czech Technical University, Zikova 4, 166 36 Prague and HASYLAB/DESY, Notkestrasse 85, D-22603 Hamburg and Department of Cell and Molecular Biology, Biomedical Centre, Box 596, Uppsala University, SE-75124 Uppsala and Institut fuer Experimentelle Physik, Universitaet Duisburg-Essen, 47048 Duisburg and Institut fuer Optik und Quantenelektronik, Universitaet Jena, 07793 Jena},
abstractNote = {Samples of B{sub 4}C, amorphous C, chemical-vapor-deposition-diamond C, Si, and SiC were exposed to single 25 fs long pulses of 32.5 nm free-electron-laser radiation at fluences of up to 2.2 J/cm{sup 2}. The samples were chosen as candidate materials for x-ray free-electron-laser optics. It was found that the threshold for surface damage is on the order of the fluence required for thermal melting. For larger fluences, the crater depths correspond to temperatures on the order of the critical temperature, suggesting that the craters are formed by two-phase vaporization.},
doi = {10.1063/1.2734366},
journal = {Applied Physics Letters},
number = 17,
volume = 90,
place = {United States},
year = {Mon Apr 23 00:00:00 EDT 2007},
month = {Mon Apr 23 00:00:00 EDT 2007}
}