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Title: Behavior of implanted strontium in yttria-stabilized zirconia

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.2713127· OSTI ID:20971872
; ; ; ;  [1]
  1. Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109-2104 (United States) and Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2104 (United States)

Yttria-stabilized zirconia (YSZ) is one of the promising candidates for application in the inert matrix fuel. This letter presents the effects of fission product strontium incorporation in the YSZ microstructure. The strontium ions were implanted at room temperature to a dose of 1x10{sup 17} ions/cm{sup 2} and that was followed by subsequently annealing at 1000 deg. C for 1-3 h. Transmission electron microscopy (TEM) was utilized to characterize the microstructure evolution after the implantation and/or annealing. No amorphization was observed in the YSZ matrix with a damage level of 200 dpa (displacements per atom). A layer of nanoscale strontium zirconate perovskite (SrZrO{sub 3}) precipitates formed in strontium-ion implanted YSZ single crystals after the annealing. Cross-sectional TEM revealed the crystalline particles of {approx}15 nm in size and they are crystallographically highly oriented with the YSZ matrix. The orientation relationship between the matrix and the precipitates has been determined as <011>{sub YSZ}(parallel sign)<111>{sub SrZrO{sub 3}}, (200){sub YSZ}(parallel sign)(110){sub SrZrO{sub 3}}. The interface is composed of misfit dislocations with b=1/2<200>{sub YSZ}.

OSTI ID:
20971872
Journal Information:
Applied Physics Letters, Vol. 90, Issue 17; Other Information: DOI: 10.1063/1.2713127; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English