Single-shot characterization of independent femtosecond extreme ultraviolet free electron and infrared laser pulses

Journal Article · Mon Mar 26 00:00:00 EDT 2007 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2716360· OSTI ID:20960172

Radcliffe, P; Duesterer, S; Azima, A; Redlin, H; Feldhaus, J; Dardis, J; Kavanagh, K; Luna, H; Gutierrez, J Pedregosa; Yeates, P; Kennedy, E T; Costello, J T; Delserieys, A; Lewis, C L. S.; Taieeb, R; Maquet, A; Cubaynes, D; Meyer, M ^[1]

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1. HASYLAB, DESY, Notkestr. 85, D-22607 Hamburg (Germany)

Two-color above threshold ionization of helium and xenon has been used to analyze the synchronization between individual pulses of the femtosecond extreme ultraviolet (XUV) free electron laser in Hamburg and an independent intense 120 fs mode-locked Ti:sapphire laser. Characteristic sidebands appear in the photoelectron spectra when the two pulses overlap spatially and temporally. The cross-correlation curve points to a 250 fs rms jitter between the two sources at the experiment. A more precise determination of the temporal fluctuation between the XUV and infrared pulses is obtained through the analysis of the single-shot sideband intensities.

• OSTI ID: 20960172
• Journal Information: Applied Physics Letters, Vol. 90, Issue 13; Other Information: DOI: 10.1063/1.2716360; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CORRELATIONS
EXTREME ULTRAVIOLET RADIATION
FREE ELECTRON LASERS
HELIUM
MODE LOCKING
MULTI-PHOTON PROCESSES
PHOTOELECTRON SPECTROSCOPY
PHOTOIONIZATION
PULSES
SAPPHIRE
SYNCHRONIZATION
XENON