Direct measurement of barrier asymmetry in AlO{sub x}/ZrO{sub y} magnetic tunnel junctions using off-axis electron holography
Journal Article
·
· Physical Review. B, Condensed Matter and Materials Physics
- Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080 (China)
- Department of Physics and Astronomy, University of Delaware, Newark, Delaware 19716 (United States)
- Beijing University of Technology, 100 Pingle Yuan, Chao Yang District, Beijing 100022 (China)
Off-axis electron holography was used to investigate the barrier profile of the Py/AlO{sub x}/ZrO{sub y}/Py magnetic tunnel junctions with different ZrO{sub y} thicknesses. The tunneling magnetoresistance (TMR) has a strong dependence on bias voltage and the bias voltage for maximum TMR is shifted from zero. This shift increases with ZrO{sub y} barrier thickness due to the increasing barrier asymmetry in the junctions. The evolution of barrier asymmetry was directly observed by the phase change of the off-axis electron holography, which unambiguously shows the barrier profile changes from triangular to trapezoidal shape as increasing of ZrO{sub y} thickness.
- OSTI ID:
- 20957790
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Vol. 75, Issue 13; Other Information: DOI: 10.1103/PhysRevB.75.134420; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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