Development of advanced x-ray imaging crystal spectrometer utilizing a large area segmented proportional counter for KSTAR

Journal Article · Fri Jun 15 00:00:00 EDT 2007 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2749441· OSTI ID:20953468

Lee, S G; Bak, J G; Nam, U W; Moon, M K; Cheon, J K ^[1]

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1. National Fusion Research Center, Taejeon 305-333 (Korea, Republic of)

An advanced x-ray imaging crystal spectrometer (XICS) for KSTAR tokamak has been developed by utilizing a segmented two dimensional (2D) position-sensitive multiwire proportional counter. The XICS for the KSTAR tokamak provides time-resolved measurements of the radial ion and electron temperature profiles, toroidal plasma rotation velocity, and ionization equilibrium. The segmented 2D detector with delay-line readout and supporting electronics has been adopted to improve the photon count rate capability. The current fabrication status of the XICS for the KSTAR tokamak and the first performance test results of the prototype segmented 2D detector are presented.

• OSTI ID: 20953468
• Journal Information: Review of Scientific Instruments, Vol. 78, Issue 6; Other Information: DOI: 10.1063/1.2749441; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COUNTING RATES
CRYSTALS
ELECTRON TEMPERATURE
ION TEMPERATURE
IONIZATION
IONS
PHOTONS
PLASMA
PLASMA CONFINEMENT
PLASMA DIAGNOSTICS
PROPORTIONAL COUNTERS
TIME RESOLUTION
TOKAMAK DEVICES
TWO-DIMENSIONAL CALCULATIONS
X RADIATION
X-RAY SPECTROMETERS