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Title: Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors

Abstract

Plasma spectroscopy requires determination of spectral line intensities and widths. At Sandia National Laboratories Z facility we use elliptical crystal spectrometers equipped with gated microchannel plate detectors to record time and space resolved spectra. We collect a large volume of data typically consisting of five to six snapshots in time and five to ten spectral lines with 30 spatial elements per frame, totaling to more than 900 measurements per experiment. This large volume of data requires efficiency in processing. We have addressed this challenge by using a line fitting routine to automatically fit each spectrum using assumed line profiles and taking into account photoelectron statistics to efficiently extract line intensities and widths with uncertainties. We verified that the random data noise obeys Poisson statistics. Rescale factors for converting film exposure to effective counts required for understanding the photoelectron statistics are presented. An example of the application of these results to the analysis of spectra recorded in Z experiments is presented.

Authors:
; ; ; ;  [1]
  1. Ktech Corporation, 1300 Eubank Boulevard, SE Albuquerque, New Mexico 87123 (United States)
Publication Date:
OSTI Identifier:
20953463
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 78; Journal Issue: 6; Other Information: DOI: 10.1063/1.2748674; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; NOISE; RANDOMNESS; SANDIA NATIONAL LABORATORIES; STATISTICS; WIDTH; X-RAY DETECTION; X-RAY SPECTRA; X-RAY SPECTROMETERS

Citation Formats

Dunham, Greg, Bailey, J E, Rochau, G A, Lake, P W, Nielsen-Weber, L B, Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185-1196, and Ktech Corporation, 1300 Eubank Boulevard, SE Albuquerque, New Mexico 87123. Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors. United States: N. p., 2007. Web. doi:10.1063/1.2748674.
Dunham, Greg, Bailey, J E, Rochau, G A, Lake, P W, Nielsen-Weber, L B, Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185-1196, & Ktech Corporation, 1300 Eubank Boulevard, SE Albuquerque, New Mexico 87123. Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors. United States. https://doi.org/10.1063/1.2748674
Dunham, Greg, Bailey, J E, Rochau, G A, Lake, P W, Nielsen-Weber, L B, Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185-1196, and Ktech Corporation, 1300 Eubank Boulevard, SE Albuquerque, New Mexico 87123. Fri . "Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors". United States. https://doi.org/10.1063/1.2748674.
@article{osti_20953463,
title = {Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors},
author = {Dunham, Greg and Bailey, J E and Rochau, G A and Lake, P W and Nielsen-Weber, L B and Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185-1196 and Ktech Corporation, 1300 Eubank Boulevard, SE Albuquerque, New Mexico 87123},
abstractNote = {Plasma spectroscopy requires determination of spectral line intensities and widths. At Sandia National Laboratories Z facility we use elliptical crystal spectrometers equipped with gated microchannel plate detectors to record time and space resolved spectra. We collect a large volume of data typically consisting of five to six snapshots in time and five to ten spectral lines with 30 spatial elements per frame, totaling to more than 900 measurements per experiment. This large volume of data requires efficiency in processing. We have addressed this challenge by using a line fitting routine to automatically fit each spectrum using assumed line profiles and taking into account photoelectron statistics to efficiently extract line intensities and widths with uncertainties. We verified that the random data noise obeys Poisson statistics. Rescale factors for converting film exposure to effective counts required for understanding the photoelectron statistics are presented. An example of the application of these results to the analysis of spectra recorded in Z experiments is presented.},
doi = {10.1063/1.2748674},
url = {https://www.osti.gov/biblio/20953463}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 6,
volume = 78,
place = {United States},
year = {2007},
month = {6}
}

Works referencing / citing this record:

Diagnosis of x-ray heated Mg/Fe opacity research plasmas
journal, November 2008