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Title: Artificial submicron or nanometer speckle fabricating technique and electron microscope speckle photography

Abstract

In this article, a novel artificial submicro- or nanometer speckle fabricating technique is proposed by taking advantage of submicro or nanometer particles. In the technique, submicron or nanometer particles were adhered to an object surface by using ultrasonic dispersing technique. The particles on the object surface can be regarded as submicro or nanometer speckle by using a scanning electronic microscope at a special magnification. In addition, an electron microscope speckle photography (EMSP) method is developed to measure in-plane submicron or nanometer deformation of the object coated with the artificial submicro or nanometer speckles. The principle of artificial submicro or nanometer speckle fabricating technique and the EMSP method are discussed in detail in this article. Some typical applications of this method are offered. The experimental results verified that the artificial submicro or nanometer speckle fabricating technique and EMSP method is feasible.

Authors:
; ; ; ; ;  [1];  [2];  [2]
  1. Department of Mechanics, School of Science, Beijing Institute of Technology, Beijing 100081 (China) and FML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084 (China)
  2. (China)
Publication Date:
OSTI Identifier:
20953384
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 78; Journal Issue: 3; Other Information: DOI: 10.1063/1.2709742; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ADHESION; DEFORMATION; ELECTRON MICROSCOPES; NANOSTRUCTURES; PARTICLES; PHOTOGRAPHY; SCANNING ELECTRON MICROSCOPY; SURFACES

Citation Formats

Liu Zhanwei, Xie Huimin, Fang Daining, Dai Fulong, Wang Weining, Fang Yan, FML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084, and Beijing key Laboratory for Nano-photonics and Nano-structure, Beijing 100037. Artificial submicron or nanometer speckle fabricating technique and electron microscope speckle photography. United States: N. p., 2007. Web. doi:10.1063/1.2709742.
Liu Zhanwei, Xie Huimin, Fang Daining, Dai Fulong, Wang Weining, Fang Yan, FML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084, & Beijing key Laboratory for Nano-photonics and Nano-structure, Beijing 100037. Artificial submicron or nanometer speckle fabricating technique and electron microscope speckle photography. United States. doi:10.1063/1.2709742.
Liu Zhanwei, Xie Huimin, Fang Daining, Dai Fulong, Wang Weining, Fang Yan, FML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084, and Beijing key Laboratory for Nano-photonics and Nano-structure, Beijing 100037. Thu . "Artificial submicron or nanometer speckle fabricating technique and electron microscope speckle photography". United States. doi:10.1063/1.2709742.
@article{osti_20953384,
title = {Artificial submicron or nanometer speckle fabricating technique and electron microscope speckle photography},
author = {Liu Zhanwei and Xie Huimin and Fang Daining and Dai Fulong and Wang Weining and Fang Yan and FML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084 and Beijing key Laboratory for Nano-photonics and Nano-structure, Beijing 100037},
abstractNote = {In this article, a novel artificial submicro- or nanometer speckle fabricating technique is proposed by taking advantage of submicro or nanometer particles. In the technique, submicron or nanometer particles were adhered to an object surface by using ultrasonic dispersing technique. The particles on the object surface can be regarded as submicro or nanometer speckle by using a scanning electronic microscope at a special magnification. In addition, an electron microscope speckle photography (EMSP) method is developed to measure in-plane submicron or nanometer deformation of the object coated with the artificial submicro or nanometer speckles. The principle of artificial submicro or nanometer speckle fabricating technique and the EMSP method are discussed in detail in this article. Some typical applications of this method are offered. The experimental results verified that the artificial submicro or nanometer speckle fabricating technique and EMSP method is feasible.},
doi = {10.1063/1.2709742},
journal = {Review of Scientific Instruments},
number = 3,
volume = 78,
place = {United States},
year = {Thu Mar 15 00:00:00 EDT 2007},
month = {Thu Mar 15 00:00:00 EDT 2007}
}