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Title: Structural properties of the multilayer graphene/4H-SiC(0001) system as determined by surface x-ray diffraction

Abstract

We present a structural analysis of the multilayer graphene/4HSiC(0001) system using surface x-ray reflectivity. We show that graphene films grown on the C-terminated (0001) surface have a graphene-substrate bond length that is very short (1.62 A). The measured distance rules out a weak van der Waals interaction to the substrate and instead indicates a strong bond between the first graphene layer and the bulk as predicted by ab initio calculations. The measurements also indicate that multilayer graphene grows in a near turbostratic mode on this surface. This result may explain the lack of a broken graphene symmetry inferred from conduction measurements on this system [C. Berger et al., Science 312, 1191 (2006)].

Authors:
; ; ; ; ; ; ; ;  [1];  [2]
  1. Georgia Institute of Technology, Atlanta, Georgia 30332-0430 (United States)
  2. (United States) and Institut Neel, Boite Postale 166, 38042 Grenoble Cedex (France)
Publication Date:
OSTI Identifier:
20951516
Resource Type:
Journal Article
Resource Relation:
Journal Name: Physical Review. B, Condensed Matter and Materials Physics; Journal Volume: 75; Journal Issue: 21; Other Information: DOI: 10.1103/PhysRevB.75.214109; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BOND LENGTHS; GRAPHITE; HYDROGEN 4; INTERFACES; LAYERS; REFLECTIVITY; ROUGHNESS; SILICON COMPOUNDS; STACKING FAULTS; SUBSTRATES; SURFACES; THIN FILMS; VAN DER WAALS FORCES; X-RAY DIFFRACTION

Citation Formats

Hass, J., Feng, R., Millan-Otoya, J. E., Li, X., Sprinkle, M., First, P. N., Heer, W. A. de, Conrad, E. H., Berger, C., and Georgia Institute of Technology, Atlanta, Georgia 30332-0430. Structural properties of the multilayer graphene/4H-SiC(0001) system as determined by surface x-ray diffraction. United States: N. p., 2007. Web. doi:10.1103/PHYSREVB.75.214109.
Hass, J., Feng, R., Millan-Otoya, J. E., Li, X., Sprinkle, M., First, P. N., Heer, W. A. de, Conrad, E. H., Berger, C., & Georgia Institute of Technology, Atlanta, Georgia 30332-0430. Structural properties of the multilayer graphene/4H-SiC(0001) system as determined by surface x-ray diffraction. United States. doi:10.1103/PHYSREVB.75.214109.
Hass, J., Feng, R., Millan-Otoya, J. E., Li, X., Sprinkle, M., First, P. N., Heer, W. A. de, Conrad, E. H., Berger, C., and Georgia Institute of Technology, Atlanta, Georgia 30332-0430. Fri . "Structural properties of the multilayer graphene/4H-SiC(0001) system as determined by surface x-ray diffraction". United States. doi:10.1103/PHYSREVB.75.214109.
@article{osti_20951516,
title = {Structural properties of the multilayer graphene/4H-SiC(0001) system as determined by surface x-ray diffraction},
author = {Hass, J. and Feng, R. and Millan-Otoya, J. E. and Li, X. and Sprinkle, M. and First, P. N. and Heer, W. A. de and Conrad, E. H. and Berger, C. and Georgia Institute of Technology, Atlanta, Georgia 30332-0430},
abstractNote = {We present a structural analysis of the multilayer graphene/4HSiC(0001) system using surface x-ray reflectivity. We show that graphene films grown on the C-terminated (0001) surface have a graphene-substrate bond length that is very short (1.62 A). The measured distance rules out a weak van der Waals interaction to the substrate and instead indicates a strong bond between the first graphene layer and the bulk as predicted by ab initio calculations. The measurements also indicate that multilayer graphene grows in a near turbostratic mode on this surface. This result may explain the lack of a broken graphene symmetry inferred from conduction measurements on this system [C. Berger et al., Science 312, 1191 (2006)].},
doi = {10.1103/PHYSREVB.75.214109},
journal = {Physical Review. B, Condensed Matter and Materials Physics},
number = 21,
volume = 75,
place = {United States},
year = {Fri Jun 01 00:00:00 EDT 2007},
month = {Fri Jun 01 00:00:00 EDT 2007}
}