Evidence for Viscoelastic Effects in Surface Capillary Waves of Molten Polymer Films
Journal Article
·
· Physical Review Letters
- Department of Physics, University of California at San Diego, La Jolla, California 92093 (United States)
- Department of Physics and Interdisciplinary Program of Integrated Biotechnology, Sogang University, Seoul 121-742 (Korea, Republic of)
- Department of Physics, Northern Illinois University, DeKalb, Illinois 60115 (United States)
- Department of Materials Science and Engineering, SUNY at Stony Brook, New York 11794 (United States)
The surface dynamics of supported ultrathin polystyrene films with thickness comparable to the radius of gyration were investigated by surface sensitive x-ray photon correlation spectroscopy. We show for the first time that the conventional model of capillary waves on a viscous liquid has to be modified to include the effects of a shear modulus in order to explain both static and dynamic scattering data from ultrathin molten polymer films.
- OSTI ID:
- 20951456
- Journal Information:
- Physical Review Letters, Vol. 98, Issue 22; Other Information: DOI: 10.1103/PhysRevLett.98.227801; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0031-9007
- Country of Publication:
- United States
- Language:
- English
Similar Records
Synchrotron x-ray scattering studies of the surface structure and dynamics of liquids and liquid films.
Capillary Wave Dynamics of Thin Polymer Films over Submerged Nanostructures
Evidence for Capillary Waves on Dewetted Polymer Film Surfaces: A Combined X-ray and Atomic Force Microscopy Study
Conference
·
Sat Jan 01 00:00:00 EST 2005
· Mat. Res. Soc. Symp. Vol. 899
·
OSTI ID:20951456
+10 more
Capillary Wave Dynamics of Thin Polymer Films over Submerged Nanostructures
Journal Article
·
Tue Nov 13 00:00:00 EST 2012
· Physical Review Letters, 109(20):Article No. 207801
·
OSTI ID:20951456
+4 more
Evidence for Capillary Waves on Dewetted Polymer Film Surfaces: A Combined X-ray and Atomic Force Microscopy Study
Journal Article
·
Tue Sep 01 00:00:00 EDT 1998
· Physical Review Letters
·
OSTI ID:20951456
+6 more