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Title: Determination of the s-Wave Scattering Length and the C{sub 6} van der Waals Coefficient of {sup 174}Yb via Photoassociation Spectroscopy

Abstract

We report photoassociation spectroscopy of {sup 174}Yb for the {sup 1}S{sub 0}-{sup 1}P{sub 1} transition at 1 {mu}K, where only the s-wave scattering state contributes to the spectra. The wave function of the s-wave scattering state is obtained from the photoassociation efficiency, and we determine that the C{sub 6} potential coefficient is 2300{+-}250 a.u. and the s-wave scattering length is 5.53{+-}0.11 nm. Based on these parameters, we discuss the scattering properties of s- and d-wave states.

Authors:
; ;  [1];  [2];  [1];  [3]
  1. Department of Physics, Graduate School of Science, Kyoto University, Kyoto 606-8502 (Japan)
  2. Department of Physics, Faculty of Science, Gakushuin University, Tokyo 171-8588 (Japan)
  3. (Japan)
Publication Date:
OSTI Identifier:
20951374
Resource Type:
Journal Article
Resource Relation:
Journal Name: Physical Review Letters; Journal Volume: 98; Journal Issue: 20; Other Information: DOI: 10.1103/PhysRevLett.98.203201; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; D WAVES; POTENTIALS; S WAVES; SCATTERING LENGTHS; SPECTROSCOPY; VAN DER WAALS FORCES; WAVE FUNCTIONS; YTTERBIUM 174

Citation Formats

Enomoto, K., Kitagawa, M., Kasa, K., Tojo, S., Takahashi, Y., and CREST, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012. Determination of the s-Wave Scattering Length and the C{sub 6} van der Waals Coefficient of {sup 174}Yb via Photoassociation Spectroscopy. United States: N. p., 2007. Web. doi:10.1103/PHYSREVLETT.98.203201.
Enomoto, K., Kitagawa, M., Kasa, K., Tojo, S., Takahashi, Y., & CREST, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012. Determination of the s-Wave Scattering Length and the C{sub 6} van der Waals Coefficient of {sup 174}Yb via Photoassociation Spectroscopy. United States. doi:10.1103/PHYSREVLETT.98.203201.
Enomoto, K., Kitagawa, M., Kasa, K., Tojo, S., Takahashi, Y., and CREST, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012. Fri . "Determination of the s-Wave Scattering Length and the C{sub 6} van der Waals Coefficient of {sup 174}Yb via Photoassociation Spectroscopy". United States. doi:10.1103/PHYSREVLETT.98.203201.
@article{osti_20951374,
title = {Determination of the s-Wave Scattering Length and the C{sub 6} van der Waals Coefficient of {sup 174}Yb via Photoassociation Spectroscopy},
author = {Enomoto, K. and Kitagawa, M. and Kasa, K. and Tojo, S. and Takahashi, Y. and CREST, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012},
abstractNote = {We report photoassociation spectroscopy of {sup 174}Yb for the {sup 1}S{sub 0}-{sup 1}P{sub 1} transition at 1 {mu}K, where only the s-wave scattering state contributes to the spectra. The wave function of the s-wave scattering state is obtained from the photoassociation efficiency, and we determine that the C{sub 6} potential coefficient is 2300{+-}250 a.u. and the s-wave scattering length is 5.53{+-}0.11 nm. Based on these parameters, we discuss the scattering properties of s- and d-wave states.},
doi = {10.1103/PHYSREVLETT.98.203201},
journal = {Physical Review Letters},
number = 20,
volume = 98,
place = {United States},
year = {Fri May 18 00:00:00 EDT 2007},
month = {Fri May 18 00:00:00 EDT 2007}
}
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