skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Soft X-Ray Laser Spectroscopy on Trapped Highly Charged Ions at FLASH

Abstract

In a proof-of-principle experiment, we demonstrate high-resolution resonant laser excitation in the soft x-ray region at 48.6 eV of the 2 {sup 2}S{sub 1/2} to 2 {sup 2}P{sub 1/2} transition of Li-like Fe{sup 23+} ions trapped in an electron beam ion trap by using ultrabrilliant light from Free Electron Laser in Hamburg (FLASH). High precision spectroscopic studies of highly charged ions at this and upcoming x-ray lasers with an expected accuracy gain up to a factor of a thousand, become possible with our technique, thus potentially yielding fundamental insights, e.g., into basic aspects of QED.

Authors:
; ; ; ; ;  [1]; ; ; ; ;  [2]; ; ;  [3]
  1. Max-Planck-Institut fuer Kernphysik, D-69117 Heidelberg (Germany)
  2. DESY, D-22607 Hamburg (Germany)
  3. Institut fuer Experimentalphysik, Universitaet Hamburg, D-22761 Hamburg (Germany)
Publication Date:
OSTI Identifier:
20951337
Resource Type:
Journal Article
Resource Relation:
Journal Name: Physical Review Letters; Journal Volume: 98; Journal Issue: 18; Other Information: DOI: 10.1103/PhysRevLett.98.183001; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ELECTRON BEAMS; FREE ELECTRON LASERS; IRON IONS; LASER SPECTROSCOPY; MULTICHARGED IONS; QUANTUM ELECTRODYNAMICS; SOFT X RADIATION; TRAPPING; X-RAY LASERS

Citation Formats

Epp, S. W., Lopez-Urrutia, J. R. Crespo, Brenner, G., Maeckel, V., Mokler, P. H., Ullrich, J., Treusch, R., Kuhlmann, M., Yurkov, M. V., Feldhaus, J., Schneider, J. R., Wellhoefer, M., Martins, M., and Wurth, W. Soft X-Ray Laser Spectroscopy on Trapped Highly Charged Ions at FLASH. United States: N. p., 2007. Web. doi:10.1103/PHYSREVLETT.98.183001.
Epp, S. W., Lopez-Urrutia, J. R. Crespo, Brenner, G., Maeckel, V., Mokler, P. H., Ullrich, J., Treusch, R., Kuhlmann, M., Yurkov, M. V., Feldhaus, J., Schneider, J. R., Wellhoefer, M., Martins, M., & Wurth, W. Soft X-Ray Laser Spectroscopy on Trapped Highly Charged Ions at FLASH. United States. doi:10.1103/PHYSREVLETT.98.183001.
Epp, S. W., Lopez-Urrutia, J. R. Crespo, Brenner, G., Maeckel, V., Mokler, P. H., Ullrich, J., Treusch, R., Kuhlmann, M., Yurkov, M. V., Feldhaus, J., Schneider, J. R., Wellhoefer, M., Martins, M., and Wurth, W. Fri . "Soft X-Ray Laser Spectroscopy on Trapped Highly Charged Ions at FLASH". United States. doi:10.1103/PHYSREVLETT.98.183001.
@article{osti_20951337,
title = {Soft X-Ray Laser Spectroscopy on Trapped Highly Charged Ions at FLASH},
author = {Epp, S. W. and Lopez-Urrutia, J. R. Crespo and Brenner, G. and Maeckel, V. and Mokler, P. H. and Ullrich, J. and Treusch, R. and Kuhlmann, M. and Yurkov, M. V. and Feldhaus, J. and Schneider, J. R. and Wellhoefer, M. and Martins, M. and Wurth, W.},
abstractNote = {In a proof-of-principle experiment, we demonstrate high-resolution resonant laser excitation in the soft x-ray region at 48.6 eV of the 2 {sup 2}S{sub 1/2} to 2 {sup 2}P{sub 1/2} transition of Li-like Fe{sup 23+} ions trapped in an electron beam ion trap by using ultrabrilliant light from Free Electron Laser in Hamburg (FLASH). High precision spectroscopic studies of highly charged ions at this and upcoming x-ray lasers with an expected accuracy gain up to a factor of a thousand, become possible with our technique, thus potentially yielding fundamental insights, e.g., into basic aspects of QED.},
doi = {10.1103/PHYSREVLETT.98.183001},
journal = {Physical Review Letters},
number = 18,
volume = 98,
place = {United States},
year = {Fri May 04 00:00:00 EDT 2007},
month = {Fri May 04 00:00:00 EDT 2007}
}