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Title: Evidence for the Rare Decay B{sup +}{yields}D{sub s}{sup +}{pi}{sup 0}

Abstract

We have searched for the rare decay B{sup +}{yields}D{sub s}{sup +}{pi}{sup 0}. The analysis is based on a sample of 232x10{sup 6} {upsilon}(4S){yields}BB decays collected with the BABAR detector at the SLAC PEP-II e{sup +}e{sup -} storage ring. We find 19.6 signal events, corresponding to a significance of 4.7{sigma}. The extracted signal yield including statistical and systematic uncertainties is 20.1{sub -6.0-1.5}{sup +6.8+0.4}, and we measure B(B{sup +}{yields}D{sub s}{sup +}{pi}{sup 0})=(1.5{sub -0.4}{sup +0.5}{+-}0.1{+-}0.2)x10{sup -5}, where the first uncertainty is statistical, the second is systematic, and the last is due to the uncertainty on the D{sub s}{sup +} decay and its daughter decay branching fractions.

Authors:
; ; ; ; ; ; ; ;  [1];  [2];  [3]; ; ; ; ;  [4]; ; ;  [5];  [6]
  1. Laboratoire de Physique des Particules, IN2P3/CNRS et Universite de Savoie, F-74941 Annecy-Le-Vieux (France)
  2. Facultat de Fisica, Departament ECM, Universitat de Barcelona, E-08028 Barcelona (Spain)
  3. Dipartimento di Fisica and INFN, Universita di Bari, I-70126 Bari (Italy)
  4. Institute of High Energy Physics, Beijing 100039 (China)
  5. Institute of Physics, University of Bergen, N-5007 Bergen (Norway)
  6. Lawrence Berkeley National Laboratory and University of California, Berkeley, California 94720 (United States) (and others)
Publication Date:
OSTI Identifier:
20951267
Resource Type:
Journal Article
Resource Relation:
Journal Name: Physical Review Letters; Journal Volume: 98; Journal Issue: 17; Other Information: DOI: 10.1103/PhysRevLett.98.171801; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; B PLUS MESONS; BRANCHING RATIO; D PLUS MESONS; PARTICLE DECAY; PARTICLE PRODUCTION; PIONS NEUTRAL; SIGNALS; STANFORD LINEAR ACCELERATOR CENTER; STORAGE RINGS

Citation Formats

Aubert, B., Bona, M., Boutigny, D., Karyotakis, Y., Lees, J. P., Poireau, V., Prudent, X., Tisserand, V., Zghiche, A., Grauges, E., Palano, A., Chen, J. C., Qi, N. D., Rong, G., Wang, P., Zhu, Y. S., Eigen, G., Ofte, I., Stugu, B., and Abrams, G. S.. Evidence for the Rare Decay B{sup +}{yields}D{sub s}{sup +}{pi}{sup 0}. United States: N. p., 2007. Web. doi:10.1103/PHYSREVLETT.98.171801.
Aubert, B., Bona, M., Boutigny, D., Karyotakis, Y., Lees, J. P., Poireau, V., Prudent, X., Tisserand, V., Zghiche, A., Grauges, E., Palano, A., Chen, J. C., Qi, N. D., Rong, G., Wang, P., Zhu, Y. S., Eigen, G., Ofte, I., Stugu, B., & Abrams, G. S.. Evidence for the Rare Decay B{sup +}{yields}D{sub s}{sup +}{pi}{sup 0}. United States. doi:10.1103/PHYSREVLETT.98.171801.
Aubert, B., Bona, M., Boutigny, D., Karyotakis, Y., Lees, J. P., Poireau, V., Prudent, X., Tisserand, V., Zghiche, A., Grauges, E., Palano, A., Chen, J. C., Qi, N. D., Rong, G., Wang, P., Zhu, Y. S., Eigen, G., Ofte, I., Stugu, B., and Abrams, G. S.. Fri . "Evidence for the Rare Decay B{sup +}{yields}D{sub s}{sup +}{pi}{sup 0}". United States. doi:10.1103/PHYSREVLETT.98.171801.
@article{osti_20951267,
title = {Evidence for the Rare Decay B{sup +}{yields}D{sub s}{sup +}{pi}{sup 0}},
author = {Aubert, B. and Bona, M. and Boutigny, D. and Karyotakis, Y. and Lees, J. P. and Poireau, V. and Prudent, X. and Tisserand, V. and Zghiche, A. and Grauges, E. and Palano, A. and Chen, J. C. and Qi, N. D. and Rong, G. and Wang, P. and Zhu, Y. S. and Eigen, G. and Ofte, I. and Stugu, B. and Abrams, G. S.},
abstractNote = {We have searched for the rare decay B{sup +}{yields}D{sub s}{sup +}{pi}{sup 0}. The analysis is based on a sample of 232x10{sup 6} {upsilon}(4S){yields}BB decays collected with the BABAR detector at the SLAC PEP-II e{sup +}e{sup -} storage ring. We find 19.6 signal events, corresponding to a significance of 4.7{sigma}. The extracted signal yield including statistical and systematic uncertainties is 20.1{sub -6.0-1.5}{sup +6.8+0.4}, and we measure B(B{sup +}{yields}D{sub s}{sup +}{pi}{sup 0})=(1.5{sub -0.4}{sup +0.5}{+-}0.1{+-}0.2)x10{sup -5}, where the first uncertainty is statistical, the second is systematic, and the last is due to the uncertainty on the D{sub s}{sup +} decay and its daughter decay branching fractions.},
doi = {10.1103/PHYSREVLETT.98.171801},
journal = {Physical Review Letters},
number = 17,
volume = 98,
place = {United States},
year = {Fri Apr 27 00:00:00 EDT 2007},
month = {Fri Apr 27 00:00:00 EDT 2007}
}