Control of retention and fatigue-free characteristics in CaBi{sub 4}Ti{sub 4}O{sub 15} thin films prepared by chemical method
- Chemistry Institute, Universidade Estadual Paulista (UNESP), Rua Prof. Francisco Degni s/n, 14801-970 Araraquara-SP (Brazil)
Ferroelectric CaBi{sub 4}Ti{sub 4}O{sub 15} (CBTi144) thin films were deposited on Pt/Ti/SiO{sub 2}/Si substrates by the polymeric precursor method. The films present a single phase of layered-structured perovskite with polar axis orientation after annealing at 700 deg. C for 2 h in static air and oxygen atmosphere. The a/b-axis orientation of the ferroelectric film is considered to be associated with the preferred orientation of the Pt bottom electrode. It is noted that the films annealed in static air showed good polarization fatigue characteristics at least up to 10{sup 10} bipolar pulse cycles and excellent retention properties up to 10{sup 4} s. On the other hand, oxygen atmosphere seems to be crucial in the decrease of both, fatigue and retention characteristics of the capacitors. Independently of the applied electric field, the retained switchable polarization approached a nearly steady-state value after a retention time of 10 s. - Graphical abstract: Fatigue of CBTi144 thin film obtained by polymeric precursor method.
- OSTI ID:
- 20905368
- Journal Information:
- Journal of Solid State Chemistry, Vol. 179, Issue 7; Other Information: DOI: 10.1016/j.jssc.2006.04.027; PII: S0022-4596(06)00241-6; Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
- Country of Publication:
- United States
- Language:
- English
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