skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Ferroelectric and dielectric properties of bismuth-layered structural Sr{sub 2}Bi{sub 4-} {sub x}Ln{sub x} Ti{sub 5}O{sub 18} (Ln=La, Nd, Sm and Dy) ceramics

Journal Article · · Journal of Solid State Chemistry
 [1];  [1];  [1];  [2]
  1. College of Physics Science and Technology, Yangzhou University, Yangzhou 225002 (China)
  2. College of Physics Science and Technology, Yangzhou University, Yangzhou 225002 (China) and National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210008 (China)

La, Nd, Sm, and Dy-doped Sr{sub 2}Bi{sub 4}Ti{sub 5}O{sub 18} (SBTi) ceramic samples have been prepared by the solid-state reaction method. The X-ray diffraction reveals that all of the ceramic samples are single phase compounds. Their remnant polarization (2P {sub r}) increases at first, and then decreases with the increase of doping content. When doping content is 0.01, Sm and Dy-doped SBTi samples exhibit the maximum 2P {sub r} of 18.2 and 20.1 {mu}C/cm{sup 2}, respectively. While La and Nd-doped SBTi samples display the maximum 2P {sub r} value of 18.4 and 19.1 {mu}C/cm{sup 2} with doping content of 0.05 and 0.10, respectively. The ferroelectric properties of Sr{sub 2}Bi{sub 4-} {sub x}Ln{sub x} Ti{sub 5}O{sub 18} are found to be dominated by the competition of the decrease of oxygen vacancy concentration and the relief of structural distortion. - Graphical abstract: The temperature dependence of the dielectric loss for (a) SBST, and (b) SBDT at 500 kHz. Display Omitted.

OSTI ID:
20905310
Journal Information:
Journal of Solid State Chemistry, Vol. 179, Issue 6; Other Information: DOI: 10.1016/j.jssc.2006.03.012; PII: S0022-4596(06)00159-9; Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
Country of Publication:
United States
Language:
English