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Title: Three inorganic-organic hybrids of bismuth(III) iodide complexes containing substituted 1,2,4-triazole organic components with charaterizations of diffuse reflectance spectra

Journal Article · · Journal of Solid State Chemistry
OSTI ID:20905289
 [1];  [2];  [1];  [1]
  1. State Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou, Fujian 350002 (China)
  2. Department of Chemistry, Sungkyunkwan University, Suwon 440-746 (Korea, Republic of)

The reactions of two kinds of substituted 1,2,4-triazoles with BiI{sub 3} yielded three inorganic-organic hybrids: [HL1]{sub 4}[Bi{sub 6}I{sub 22}].[L1]{sub 4}.4H{sub 2}O (1) (L1=3-(1,2,4-triazole-4-yl)-1H-1,2,4-triazole); [HL2]{sub 4}[Bi{sub 6}I{sub 22}].6H{sub 2}O (2); [HL2]{sub 2}[Bi{sub 2}I{sub 8}].[L2]{sub 2} (3) (L2=(m-phenol)-1,2,4-triazole). Both 1 and 2 have polynuclear anions of [Bi{sub 6}I{sub 22}]{sup 4-} to build up the inorganic layers and substituted 1,2,4-triazoles as the organic layers. Hybrid 3 consists of two BiI{sub 5} square pyramids as inorganic layers. There exist hydrogen bondings and I...;I interactions in the structures of 1, 2 and 3. Optical absorption spectra of 1, 2 and 3 reveal the presence of sharp optical gaps of 1.77, 1.77 and 2.07 eV, respectively, suggesting that these materials behave as semiconductors. - Graphical abstract: The reactions of two kinds of the substituted 1,2,4-triazoles with BiI{sub 3} yielded three layered inorganic-organic hybrids [HL1]{sub 4}[Bi{sub 6}I{sub 22}].[L1]{sub 4}.4H{sub 2}O (1), [HL2]{sub 4}[Bi{sub 6}I{sub 22}].6H{sub 2}O (2), [HL2]{sub 2}[Bi{sub 2}I{sub 8}].[L2]{sub 2} (3) with optical gaps of 1.77, 1.77 and 2.07 eV, respectively. The structures of 1-3 are constructed from inorganic layers of polynuclear anions of bismuth iodine and organic layers of the substituted 1,2,4-triazoles.

OSTI ID:
20905289
Journal Information:
Journal of Solid State Chemistry, Vol. 179, Issue 6; Other Information: DOI: 10.1016/j.jssc.2006.02.011; PII: S0022-4596(06)00106-X; Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
Country of Publication:
United States
Language:
English