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Title: 3D reconstruction and characterization of polycrystalline microstructures using a FIB-SEM system

Abstract

A novel methodology is described in this paper which is a step towards three-dimensional representation of grain structures for microstructure characterization and processing microstructural data for subsequent computational analysis. It facilitates evaluation of stereological parameters of grain structures from a series of two-dimensional (2D) electron backscatter diffraction (EBSD) maps. Crystallographic orientation maps of consecutive serial sections of a micron-size specimen are collected in an automated manner using a dual-beam focused ion beam-scanning electron microscope (FIB-SEM) outfitted with an EBSD system. Analysis of the serial-sectioning data is accomplished using a special purpose software program called 'Micro-Imager'. Micro-Imager is able to output characterization parameters such as the distribution of grain size, number of neighboring grains, and grain orientation and misorientation for every 2D section. Some of these data can be compared with results from stereological exercises. Stacking the 2D statistical information obtained from the analysis of the serial-sectioning data provides a means to quantify the variability of grain structure in 3D.

Authors:
 [1];  [2];  [3];  [3];  [4]
  1. Department of Materials Science and Engineering, Ohio State University, Columbus, OH 43210 (United States)
  2. Department of Computer Science and Engineering, Ohio State University, Columbus, OH 43210 (United States)
  3. Air Force Research Laboratory, Materials and Manufacturing Directorate, AFRL/MLLMD, Wright-Patterson AFB, OH 45433-7817 (United States)
  4. Department of Mechanical Engineering, The Ohio State University, Columbus, OH 43210 (United States)
Publication Date:
OSTI Identifier:
20889852
Resource Type:
Journal Article
Journal Name:
Materials Characterization
Additional Journal Information:
Journal Volume: 57; Journal Issue: 4-5; Other Information: DOI: 10.1016/j.matchar.2006.01.019; PII: S1044-5803(06)00062-3; Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1044-5803
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BACKSCATTERING; CRYSTALLOGRAPHY; DISTRIBUTION; ELECTRON DIFFRACTION; GRAIN ORIENTATION; GRAIN SIZE; ION BEAMS; M CODES; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; SYSTEMS ANALYSIS; THREE-DIMENSIONAL CALCULATIONS; TWO-DIMENSIONAL CALCULATIONS

Citation Formats

Groeber, M A, Haley, B K, Uchic, M D, Dimiduk, D M, and Ghosh, S. 3D reconstruction and characterization of polycrystalline microstructures using a FIB-SEM system. United States: N. p., 2006. Web. doi:10.1016/j.matchar.2006.01.019.
Groeber, M A, Haley, B K, Uchic, M D, Dimiduk, D M, & Ghosh, S. 3D reconstruction and characterization of polycrystalline microstructures using a FIB-SEM system. United States. doi:10.1016/j.matchar.2006.01.019.
Groeber, M A, Haley, B K, Uchic, M D, Dimiduk, D M, and Ghosh, S. Fri . "3D reconstruction and characterization of polycrystalline microstructures using a FIB-SEM system". United States. doi:10.1016/j.matchar.2006.01.019.
@article{osti_20889852,
title = {3D reconstruction and characterization of polycrystalline microstructures using a FIB-SEM system},
author = {Groeber, M A and Haley, B K and Uchic, M D and Dimiduk, D M and Ghosh, S},
abstractNote = {A novel methodology is described in this paper which is a step towards three-dimensional representation of grain structures for microstructure characterization and processing microstructural data for subsequent computational analysis. It facilitates evaluation of stereological parameters of grain structures from a series of two-dimensional (2D) electron backscatter diffraction (EBSD) maps. Crystallographic orientation maps of consecutive serial sections of a micron-size specimen are collected in an automated manner using a dual-beam focused ion beam-scanning electron microscope (FIB-SEM) outfitted with an EBSD system. Analysis of the serial-sectioning data is accomplished using a special purpose software program called 'Micro-Imager'. Micro-Imager is able to output characterization parameters such as the distribution of grain size, number of neighboring grains, and grain orientation and misorientation for every 2D section. Some of these data can be compared with results from stereological exercises. Stacking the 2D statistical information obtained from the analysis of the serial-sectioning data provides a means to quantify the variability of grain structure in 3D.},
doi = {10.1016/j.matchar.2006.01.019},
journal = {Materials Characterization},
issn = {1044-5803},
number = 4-5,
volume = 57,
place = {United States},
year = {2006},
month = {12}
}