X-ray diffraction analysis of Zn{sub 0.85}Co{sub 0.15}O powder and thin films

Journal Article · Wed Nov 26 00:00:00 EST 2003 · Materials Research Bulletin

OSTI ID:20884618

Zeming, Qi; Aixia, Li; Fenglian, Su; Shengming, Zhou; Yanmei, Liu; Zongyan, Zhao

Co-doped ZnO powder and thin films on Si(1 0 0) substrate were prepared by solid-phase reaction and reactive e-beam evaporation. All samples were characterized by X-ray diffraction. The structure of powder sample was determined using Rietveld full-profile analysis method. The study of the influence of substrate temperature on the structure of thin films samples showed that the quality of thin films depended largely on the substrate temperature. The film prepared at 400 deg. C had the highest quality with c-axis (0 0 2) preferred orientation.

• OSTI ID: 20884618
• Journal Information: Materials Research Bulletin, Vol. 38, Issue 14; Other Information: DOI: 10.1016/j.materresbull.2003.09.006; PII: S0025540803002496; Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COBALT OXIDES
CRYSTAL STRUCTURE
DOPED MATERIALS
ELECTRON BEAMS
EVAPORATION
GRAIN ORIENTATION
POWDERS
SUBSTRATES
THIN FILMS
X-RAY DIFFRACTION
ZINC OXIDES