Hard x-ray contact microscopy with 250 nm spatial resolution using a LiF film detector and a tabletop microsource

Journal Article · Mon Jul 31 00:00:00 EDT 2006 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2236283· OSTI ID:20860660

Almaviva, S; Bonfigli, F; Franzini, I; Lai, A; Montereali, R M; Pelliccia, D; Cedola, A; Lagomarsino, S ^[1]

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1. ENEA, Advanced Physical Technologies, C. R. Frascati, V. E. Fermi 45, 00044 Frascati (RM) (Italy)

An innovative route for deep-submicrometer spatial resolution hard x-ray microscopy with tabletop x-ray source is proposed. A film of lithium fluoride (LiF) was used as imaging detector in contact mode. We present here the x-ray images recorded on LiF films of a Fresnel zone plate with submicrometer gold structures and of an onion cataphyll. The images were read with an optical confocal microscope in fluorescence mode. The measured spatial resolution was about 250 nm, i.e., close to the resolution limit of the confocal microscope. The advantages and drawbacks, and the possible improvements, of this route are discussed.

• OSTI ID: 20860660
• Journal Information: Applied Physics Letters, Vol. 89, Issue 5; Other Information: DOI: 10.1063/1.2236283; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
FLUORESCENCE
FRESNEL LENS
GOLD
HARD X RADIATION
IMAGES
LITHIUM FLUORIDES
MICROSCOPES
OPTICAL MICROSCOPY
SPATIAL RESOLUTION
THIN FILMS
X-RAY DETECTION
X-RAY SOURCES