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Title: Prediction and observation of tin and silver plasmas with index of refraction greater than one in the soft x-ray range

Abstract

We present the calculated prediction and the experimental confirmation that doubly ionized Ag and Sn plasmas can have an index of refraction greater than one for soft x-ray wavelengths. Interferometry experiments conducted using a capillary discharge soft x-ray laser operating at a wavelength of 46.9 nm (26.44 eV) confirm that in few times ionized laser-created plasmas of these elements the anomalous dispersion from bound electrons can dominate the free electron contribution, making the index of refraction greater than one. The results confirm that bound electrons can strongly influence the index of refraction of numerous plasmas over a broad range of soft x-ray wavelengths confirming recent observations. The understanding of index of refraction at short wavelengths will become even more essential during the next decade as x-ray free electron lasers will become available to probe a wider variety of plasmas at higher densities and shorter wavelengths.

Authors:
 [1]; ; ;  [2];  [2]; ; ;  [3]
  1. Department of Physics, NSF ERC for Extreme Ultraviolet Science and Technology, Colorado State University, Fort Collins, Colorado 80523 (United States)
  2. Department of Electrical and Computer Engineering NSF ERC for Extreme Ultraviolet Science and Technology, Colorado State University, Fort Collins, Colorado 80523 (United States)
  3. Lawrence Livermore National Laboratory, Livermore, California 94551 (United States)
Publication Date:
OSTI Identifier:
20860619
Resource Type:
Journal Article
Journal Name:
Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics
Additional Journal Information:
Journal Volume: 74; Journal Issue: 1; Other Information: DOI: 10.1103/PhysRevE.74.016404; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-651X
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; CAPILLARIES; ELECTRONS; FREE ELECTRON LASERS; INTERFEROMETRY; LASER-PRODUCED PLASMA; PLASMA DENSITY; PLASMA DIAGNOSTICS; PLASMA PRODUCTION; REFRACTIVE INDEX; SILVER; SOFT X RADIATION; TIN; WAVELENGTHS; X-RAY SOURCES

Citation Formats

Filevich, Jorge, Grava, Jonathan, Purvis, Mike, Marconi, Mario C, Rocca, Jorge J, Department of Physics, NSF ERC for Extreme Ultraviolet Science and Technology, Colorado State University, Fort Collins, Colorado 80523, Nilsen, Joseph, Dunn, James, Johnson, Walter R, and University of Notre Dame, Notre Dame, Indiana 46556. Prediction and observation of tin and silver plasmas with index of refraction greater than one in the soft x-ray range. United States: N. p., 2006. Web. doi:10.1103/PHYSREVE.74.016404.
Filevich, Jorge, Grava, Jonathan, Purvis, Mike, Marconi, Mario C, Rocca, Jorge J, Department of Physics, NSF ERC for Extreme Ultraviolet Science and Technology, Colorado State University, Fort Collins, Colorado 80523, Nilsen, Joseph, Dunn, James, Johnson, Walter R, & University of Notre Dame, Notre Dame, Indiana 46556. Prediction and observation of tin and silver plasmas with index of refraction greater than one in the soft x-ray range. United States. https://doi.org/10.1103/PHYSREVE.74.016404
Filevich, Jorge, Grava, Jonathan, Purvis, Mike, Marconi, Mario C, Rocca, Jorge J, Department of Physics, NSF ERC for Extreme Ultraviolet Science and Technology, Colorado State University, Fort Collins, Colorado 80523, Nilsen, Joseph, Dunn, James, Johnson, Walter R, and University of Notre Dame, Notre Dame, Indiana 46556. 2006. "Prediction and observation of tin and silver plasmas with index of refraction greater than one in the soft x-ray range". United States. https://doi.org/10.1103/PHYSREVE.74.016404.
@article{osti_20860619,
title = {Prediction and observation of tin and silver plasmas with index of refraction greater than one in the soft x-ray range},
author = {Filevich, Jorge and Grava, Jonathan and Purvis, Mike and Marconi, Mario C and Rocca, Jorge J and Department of Physics, NSF ERC for Extreme Ultraviolet Science and Technology, Colorado State University, Fort Collins, Colorado 80523 and Nilsen, Joseph and Dunn, James and Johnson, Walter R and University of Notre Dame, Notre Dame, Indiana 46556},
abstractNote = {We present the calculated prediction and the experimental confirmation that doubly ionized Ag and Sn plasmas can have an index of refraction greater than one for soft x-ray wavelengths. Interferometry experiments conducted using a capillary discharge soft x-ray laser operating at a wavelength of 46.9 nm (26.44 eV) confirm that in few times ionized laser-created plasmas of these elements the anomalous dispersion from bound electrons can dominate the free electron contribution, making the index of refraction greater than one. The results confirm that bound electrons can strongly influence the index of refraction of numerous plasmas over a broad range of soft x-ray wavelengths confirming recent observations. The understanding of index of refraction at short wavelengths will become even more essential during the next decade as x-ray free electron lasers will become available to probe a wider variety of plasmas at higher densities and shorter wavelengths.},
doi = {10.1103/PHYSREVE.74.016404},
url = {https://www.osti.gov/biblio/20860619}, journal = {Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics},
issn = {1063-651X},
number = 1,
volume = 74,
place = {United States},
year = {Sat Jul 15 00:00:00 EDT 2006},
month = {Sat Jul 15 00:00:00 EDT 2006}
}