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Title: Phase-dependent atomic ionization in few-cycle intense laser fields

Abstract

We have studied the carrier-envelope phase-dependent above-threshold-ionization processes by solving the time-dependent Schroedinger equation nonperturbatively. Our simulated carrier-envelope phase-dependent above-threshold-ionization spectra are in good agreement with the experimental measurement of Paulus et al. [Phys. Rev. Lett. 91, 253004 (2003)] if we shift the experimental carrier-envelope phase by 0.15{pi}. This means that we have recalibrated the carrier-envelope phase more accurately by comparing our simulations with the experimental measurements. Furthermore, by tracing back the origin of the ionized electrons, we have clearly identified that the low-energy electrons come from the direct ionization by the laser field and the high-energy electrons come from the recollision with the parent core after being bounced back by the laser field.

Authors:
;  [1];  [1]
  1. Institute of Materials Science, Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573 (Japan)
Publication Date:
OSTI Identifier:
20857638
Resource Type:
Journal Article
Journal Name:
Physical Review. A
Additional Journal Information:
Journal Volume: 74; Journal Issue: 3; Other Information: DOI: 10.1103/PhysRevA.74.031405; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1050-2947
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; COMPUTERIZED SIMULATION; ELECTRONS; ENERGY SPECTRA; LASER RADIATION; OPTICS; PHOTOIONIZATION; PHOTON-ATOM COLLISIONS; SCHROEDINGER EQUATION; TIME DEPENDENCE

Citation Formats

Tong, X M, Hino, K, Center for Computational Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8577, and Toshima, N. Phase-dependent atomic ionization in few-cycle intense laser fields. United States: N. p., 2006. Web. doi:10.1103/PHYSREVA.74.031405.
Tong, X M, Hino, K, Center for Computational Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8577, & Toshima, N. Phase-dependent atomic ionization in few-cycle intense laser fields. United States. doi:10.1103/PHYSREVA.74.031405.
Tong, X M, Hino, K, Center for Computational Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8577, and Toshima, N. Fri . "Phase-dependent atomic ionization in few-cycle intense laser fields". United States. doi:10.1103/PHYSREVA.74.031405.
@article{osti_20857638,
title = {Phase-dependent atomic ionization in few-cycle intense laser fields},
author = {Tong, X M and Hino, K and Center for Computational Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8577 and Toshima, N},
abstractNote = {We have studied the carrier-envelope phase-dependent above-threshold-ionization processes by solving the time-dependent Schroedinger equation nonperturbatively. Our simulated carrier-envelope phase-dependent above-threshold-ionization spectra are in good agreement with the experimental measurement of Paulus et al. [Phys. Rev. Lett. 91, 253004 (2003)] if we shift the experimental carrier-envelope phase by 0.15{pi}. This means that we have recalibrated the carrier-envelope phase more accurately by comparing our simulations with the experimental measurements. Furthermore, by tracing back the origin of the ionized electrons, we have clearly identified that the low-energy electrons come from the direct ionization by the laser field and the high-energy electrons come from the recollision with the parent core after being bounced back by the laser field.},
doi = {10.1103/PHYSREVA.74.031405},
journal = {Physical Review. A},
issn = {1050-2947},
number = 3,
volume = 74,
place = {United States},
year = {2006},
month = {9}
}