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Title: X-ray resonant magnetic scattering study of magnetic stripe domains in a-GdFe thin films

Abstract

X-ray resonant magnetic scattering (XRMS) has been used to investigate the structure of magnetic stripe domain patterns in thin amorphous GdFe films. Under the influence of a perpendicular magnetic field, the scattered intensity displays a smooth transition from a structure factor of correlated stripes to the form factor of isolated domains. We derive a quite general expression that relates the total scattered intensity of XRMS to the absolute value of the magnetization. Furthermore, we compare our results for the domain period with domain theory. We obtain good agreement for prealigned stripes, but disorder tends to lead to an overestimation of the period measured with XRMS.

Authors:
; ; ;  [1]; ;  [2]
  1. Van der Waals-Zeeman Institute, University of Amsterdam, Valckenierstraat 65, 1018 XE, Amsterdam (Netherlands)
  2. European Synchrotron Radiation Facility, ESRF, Boite Postale 220, F-38043 Grenoble Cedex (France)
Publication Date:
OSTI Identifier:
20853638
Resource Type:
Journal Article
Journal Name:
Physical Review. B, Condensed Matter and Materials Physics
Additional Journal Information:
Journal Volume: 74; Journal Issue: 9; Other Information: DOI: 10.1103/PhysRevB.74.094437; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1098-0121
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; COMPARATIVE EVALUATIONS; FORM FACTORS; GADOLINIUM ALLOYS; IRON ALLOYS; MAGNETIC FIELDS; MAGNETIZATION; METALLIC GLASSES; STRUCTURE FACTORS; THIN FILMS; X RADIATION; X-RAY DIFFRACTION

Citation Formats

Miguel, J, Peters, J F, Toulemonde, O M, Goedkoop, J B, Dhesi, S S, and Brookes, N B. X-ray resonant magnetic scattering study of magnetic stripe domains in a-GdFe thin films. United States: N. p., 2006. Web. doi:10.1103/PHYSREVB.74.094437.
Miguel, J, Peters, J F, Toulemonde, O M, Goedkoop, J B, Dhesi, S S, & Brookes, N B. X-ray resonant magnetic scattering study of magnetic stripe domains in a-GdFe thin films. United States. https://doi.org/10.1103/PHYSREVB.74.094437
Miguel, J, Peters, J F, Toulemonde, O M, Goedkoop, J B, Dhesi, S S, and Brookes, N B. 2006. "X-ray resonant magnetic scattering study of magnetic stripe domains in a-GdFe thin films". United States. https://doi.org/10.1103/PHYSREVB.74.094437.
@article{osti_20853638,
title = {X-ray resonant magnetic scattering study of magnetic stripe domains in a-GdFe thin films},
author = {Miguel, J and Peters, J F and Toulemonde, O M and Goedkoop, J B and Dhesi, S S and Brookes, N B},
abstractNote = {X-ray resonant magnetic scattering (XRMS) has been used to investigate the structure of magnetic stripe domain patterns in thin amorphous GdFe films. Under the influence of a perpendicular magnetic field, the scattered intensity displays a smooth transition from a structure factor of correlated stripes to the form factor of isolated domains. We derive a quite general expression that relates the total scattered intensity of XRMS to the absolute value of the magnetization. Furthermore, we compare our results for the domain period with domain theory. We obtain good agreement for prealigned stripes, but disorder tends to lead to an overestimation of the period measured with XRMS.},
doi = {10.1103/PHYSREVB.74.094437},
url = {https://www.osti.gov/biblio/20853638}, journal = {Physical Review. B, Condensed Matter and Materials Physics},
issn = {1098-0121},
number = 9,
volume = 74,
place = {United States},
year = {Fri Sep 01 00:00:00 EDT 2006},
month = {Fri Sep 01 00:00:00 EDT 2006}
}