Simple and inexpensive time-of-flight charge-to-mass analyzer for ion beam source characterization
Journal Article
·
· Review of Scientific Instruments
- High Current Electronics Institute, Russian Academy of Sciences, 2/3 Akademichesky Avenue, Tomsk 634055 (Russian Federation)
We describe the design, electronics, and test results of a simple and low-cost time-of-flight ion charge-to-mass analyzer that is suitable for ion source characterization. The method selects a short-time sample of the beam whose charge-to-mass composition is then separated according to ion velocity and detected by a remote Faraday cup. The analyzer is a detachable device that has been used for rapid analysis of charge-to-mass composition of ion beams accelerated by voltages of up to about 100 kV.
- OSTI ID:
- 20853283
- Journal Information:
- Review of Scientific Instruments, Vol. 77, Issue 6; Other Information: DOI: 10.1063/1.2206778; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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