Simple and inexpensive time-of-flight charge-to-mass analyzer for ion beam source characterization

Journal Article · Thu Jun 15 00:00:00 EDT 2006 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2206778· OSTI ID:20853283

Gushenets, V I; Nikolaev, A G; Oks, E M; Vintizenko, L G; Yushkov, G Yu; Oztarhan, A; Brown, I G ^[1]

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1. High Current Electronics Institute, Russian Academy of Sciences, 2/3 Akademichesky Avenue, Tomsk 634055 (Russian Federation)

We describe the design, electronics, and test results of a simple and low-cost time-of-flight ion charge-to-mass analyzer that is suitable for ion source characterization. The method selects a short-time sample of the beam whose charge-to-mass composition is then separated according to ion velocity and detected by a remote Faraday cup. The analyzer is a detachable device that has been used for rapid analysis of charge-to-mass composition of ion beams accelerated by voltages of up to about 100 kV.

• OSTI ID: 20853283
• Journal Information: Review of Scientific Instruments, Vol. 77, Issue 6; Other Information: DOI: 10.1063/1.2206778; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DESIGN
ELECTRIC POTENTIAL
EQUIPMENT
FARADAY CUPS
ION BEAMS
ION SOURCES
IONS
MASS
PARTICLE BEAMS
TIME-OF-FLIGHT MASS SPECTROMETERS
TIME-OF-FLIGHT METHOD