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Title: On the optical, structural, and morphological properties of ZrO{sub 2} and TiO{sub 2} dip-coated thin films supported on glass substrates

Abstract

This article reports the optical and morphological properties of dip-coated TiO{sub 2} and ZrO{sub 2} thin films on soda-lime glass substrates by metal-organic decomposition (MOD) of titanium{sup IV} and zirconium{sup IV} acetylacetonates respectively. Thermogravimetric and differential thermal analysis (DTA-TG) were performed on the precursor powders, indicating pure TiO{sub 2} anatase and tetragonal ZrO{sub 2} phase formation. Phase crystallization processes took place in the range of 300-500 deg. C for anatase and of 410-500 deg. C for ZrO{sub 2}. Fourier Transform Infrared Spectroscopy (FT-IR) was used to confirm precursor bidentate ligand formation with keno-enolic equilibrium character. Deposited films were heated at different temperatures, and their structural, optical and morphological properties were studied by grazing-incidence X-ray Diffraction (GIXRD) and X-Ray Photoelectron Spectroscopy (XPS), Ultraviolet Visible Spectroscopy (UV-Vis), and Atomic Force Microscopy (AFM) respectively. Film thinning and crystalline phase formation were enhanced with increasing temperature upon chelate decomposition. The optimum annealing temperature for both pure anatase TiO{sub 2} and tetragonal ZrO{sub 2} thin films was found to be 500 deg. C since solid volume fraction increased with temperature and film refractive index values approached those of pure anatase and tetragonal zirconia. Conditions for clean stoichiometric film formation with an average roughness value ofmore » 2 nm are discussed in terms of material binding energies indicated by XPS analyses, refractive index and solid volume fraction obtained indirectly by UV-Vis spectra, and crystalline peak identification provided by GIXRD.« less

Authors:
 [1];  [1];  [2];  [3]
  1. Facultad de Ciencias Quimicas, Division de Estudios Superiores, Universidad Autonoma de Nuevo Leon, A.P. 1864, Monterrey, N.L. (Mexico)
  2. Facultad de Ciencias Quimicas, Division de Estudios Superiores, Universidad Autonoma de Nuevo Leon, A.P. 1864, Monterrey, N.L. (Mexico). E-mail: lettorresg@yahoo.com
  3. Centro de Ciencias de la Materia Condensada, UNAM, Km. 107 Carr. Tij.-Ens., Ensenada, B.C., 22860 (Mexico)
Publication Date:
OSTI Identifier:
20833169
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Characterization; Journal Volume: 55; Journal Issue: 4-5; Other Information: DOI: 10.1016/j.matchar.2005.05.004; PII: S1044-5803(05)00119-1; Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ANNEALING; ATOMIC FORCE MICROSCOPY; CHELATES; CRYSTALLIZATION; DECOMPOSITION; DIFFERENTIAL THERMAL ANALYSIS; FOURIER TRANSFORM SPECTROMETERS; FOURIER TRANSFORMATION; INFRARED SPECTRA; REFRACTIVE INDEX; THERMAL GRAVIMETRIC ANALYSIS; THIN FILMS; TITANIUM OXIDES; ULTRAVIOLET RADIATION; ULTRAVIOLET SPECTRA; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIUM OXIDES

Citation Formats

Cueto, Luisa F., Sanchez, Enrique, Torres-Martinez, Leticia M., and Hirata, Gustavo A.. On the optical, structural, and morphological properties of ZrO{sub 2} and TiO{sub 2} dip-coated thin films supported on glass substrates. United States: N. p., 2005. Web. doi:10.1016/j.matchar.2005.05.004.
Cueto, Luisa F., Sanchez, Enrique, Torres-Martinez, Leticia M., & Hirata, Gustavo A.. On the optical, structural, and morphological properties of ZrO{sub 2} and TiO{sub 2} dip-coated thin films supported on glass substrates. United States. doi:10.1016/j.matchar.2005.05.004.
Cueto, Luisa F., Sanchez, Enrique, Torres-Martinez, Leticia M., and Hirata, Gustavo A.. Tue . "On the optical, structural, and morphological properties of ZrO{sub 2} and TiO{sub 2} dip-coated thin films supported on glass substrates". United States. doi:10.1016/j.matchar.2005.05.004.
@article{osti_20833169,
title = {On the optical, structural, and morphological properties of ZrO{sub 2} and TiO{sub 2} dip-coated thin films supported on glass substrates},
author = {Cueto, Luisa F. and Sanchez, Enrique and Torres-Martinez, Leticia M. and Hirata, Gustavo A.},
abstractNote = {This article reports the optical and morphological properties of dip-coated TiO{sub 2} and ZrO{sub 2} thin films on soda-lime glass substrates by metal-organic decomposition (MOD) of titanium{sup IV} and zirconium{sup IV} acetylacetonates respectively. Thermogravimetric and differential thermal analysis (DTA-TG) were performed on the precursor powders, indicating pure TiO{sub 2} anatase and tetragonal ZrO{sub 2} phase formation. Phase crystallization processes took place in the range of 300-500 deg. C for anatase and of 410-500 deg. C for ZrO{sub 2}. Fourier Transform Infrared Spectroscopy (FT-IR) was used to confirm precursor bidentate ligand formation with keno-enolic equilibrium character. Deposited films were heated at different temperatures, and their structural, optical and morphological properties were studied by grazing-incidence X-ray Diffraction (GIXRD) and X-Ray Photoelectron Spectroscopy (XPS), Ultraviolet Visible Spectroscopy (UV-Vis), and Atomic Force Microscopy (AFM) respectively. Film thinning and crystalline phase formation were enhanced with increasing temperature upon chelate decomposition. The optimum annealing temperature for both pure anatase TiO{sub 2} and tetragonal ZrO{sub 2} thin films was found to be 500 deg. C since solid volume fraction increased with temperature and film refractive index values approached those of pure anatase and tetragonal zirconia. Conditions for clean stoichiometric film formation with an average roughness value of 2 nm are discussed in terms of material binding energies indicated by XPS analyses, refractive index and solid volume fraction obtained indirectly by UV-Vis spectra, and crystalline peak identification provided by GIXRD.},
doi = {10.1016/j.matchar.2005.05.004},
journal = {Materials Characterization},
number = 4-5,
volume = 55,
place = {United States},
year = {Tue Nov 15 00:00:00 EST 2005},
month = {Tue Nov 15 00:00:00 EST 2005}
}
  • Thin films of SrBi{sub 4}Ti{sub 4}O{sub 15} (SBTi), a prototype of the Bi-layered-ferroelectric oxide family, were obtained by a soft chemical method and crystallized in a domestic microwave oven. For comparison, films were also crystallized in a conventional method at 700 deg. C for 2 h. Structural and morphological characterization of the SBTi thin films were investigated by X-ray diffraction (XRD) and atomic force microscopy (AFM), respectively. Using platinum coated silicon substrates, the ferroelectric properties of the films were determined. Remanent polarization P{sub r} and a coercive field E{sub c} values of 5.1 {mu}C/cm{sup 2} and 135 kV/cm for themore » film thermally treated in the microwave oven and 5.4 {mu}C/cm{sup 2} and 85 kV/cm for the film thermally treated in conventional furnace were found. The films thermally treated in the conventional furnace exhibited excellent fatigue-free characteristics up to 10{sup 10} switching cycles indicating that SBTi thin films are a promising material for use in non-volatile memories.« less
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