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Title: Fabrication and Characterization of YBCO Coated Conductors by Inclined Substrate Deposition

Abstract

Inclined substrate deposition (ISD) is an effective method for rapid fabrication of high-quality template layers for YBCO-coated conductors. We have deposited biaxially textured ISD-MgO films on flexible metallic tapes in a reel-to-reel system by electron-beam evaporation at rapid deposition rates, 2-10 nm{center_dot}s-1. Strontium ruthenium oxide (SRO) buffer and YBCO films were grown by pulsed laser deposition (PLD). Pole figure analysis of a meter-long ISD-MgO tape was carried out by X-ray diffraction using a Bruker's D8 DISCOVER equipped with GADDS (general area detection diffraction system). The c-axis of the ISD-MgO film was tilted away from substrate normal. A full-width at half maximum (FWHM) of {approx_equal}10 deg. was observed from the {phi}-scan of the MgO (002) diffraction measured on samples deposited with 35 deg. inclination angle. Surface morphology measured by atomic force microscopy revealed a roof-tile shaped structure for the ISD-MgO films. Through the use of the SRO buffer, biaxial alignment in the YBCO film deposited on the ISD-MgO template was improved. The {phi}-scan FWHM was 5.8 deg. for the YBCO (005) diffraction. We have measured the critical transition temperature Tc = 91 K and transport critical current density Jc >1.6x106 A{center_dot}cm-2 at 77 K in self-field on a SRO-buffered YBCO filmmore » grown with ISD-MgO architecture.« less

Authors:
;  [1]; ;  [2]
  1. Argonne National Laboratory, Argonne, Illinois 60439 (United States)
  2. UES, Inc., Dayton, Ohio 45432 (United States)
Publication Date:
OSTI Identifier:
20800189
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 824; Journal Issue: 1; Conference: Cryogenic engineering conference, Keystone, CO (United States), 29 Aug - 2 Sep 2005; Other Information: DOI: 10.1063/1.2192418; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; CRITICAL CURRENT; CUPRATES; CURRENT DENSITY; ELECTRON BEAMS; ENERGY BEAM DEPOSITION; FABRICATION; HIGH-TC SUPERCONDUCTORS; LASER RADIATION; LAYERS; MAGNESIUM OXIDES; MORPHOLOGY; PULSED IRRADIATION; RUTHENIUM OXIDES; STRONTIUM OXIDES; SUBSTRATES; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; TRANSITION TEMPERATURE; X-RAY DIFFRACTION; YTTRIUM COMPOUNDS

Citation Formats

Ma, B., Balachandran, U., Xu, Y., and Bhattacharya, R.. Fabrication and Characterization of YBCO Coated Conductors by Inclined Substrate Deposition. United States: N. p., 2006. Web. doi:10.1063/1.2192418.
Ma, B., Balachandran, U., Xu, Y., & Bhattacharya, R.. Fabrication and Characterization of YBCO Coated Conductors by Inclined Substrate Deposition. United States. doi:10.1063/1.2192418.
Ma, B., Balachandran, U., Xu, Y., and Bhattacharya, R.. Fri . "Fabrication and Characterization of YBCO Coated Conductors by Inclined Substrate Deposition". United States. doi:10.1063/1.2192418.
@article{osti_20800189,
title = {Fabrication and Characterization of YBCO Coated Conductors by Inclined Substrate Deposition},
author = {Ma, B. and Balachandran, U. and Xu, Y. and Bhattacharya, R.},
abstractNote = {Inclined substrate deposition (ISD) is an effective method for rapid fabrication of high-quality template layers for YBCO-coated conductors. We have deposited biaxially textured ISD-MgO films on flexible metallic tapes in a reel-to-reel system by electron-beam evaporation at rapid deposition rates, 2-10 nm{center_dot}s-1. Strontium ruthenium oxide (SRO) buffer and YBCO films were grown by pulsed laser deposition (PLD). Pole figure analysis of a meter-long ISD-MgO tape was carried out by X-ray diffraction using a Bruker's D8 DISCOVER equipped with GADDS (general area detection diffraction system). The c-axis of the ISD-MgO film was tilted away from substrate normal. A full-width at half maximum (FWHM) of {approx_equal}10 deg. was observed from the {phi}-scan of the MgO (002) diffraction measured on samples deposited with 35 deg. inclination angle. Surface morphology measured by atomic force microscopy revealed a roof-tile shaped structure for the ISD-MgO films. Through the use of the SRO buffer, biaxial alignment in the YBCO film deposited on the ISD-MgO template was improved. The {phi}-scan FWHM was 5.8 deg. for the YBCO (005) diffraction. We have measured the critical transition temperature Tc = 91 K and transport critical current density Jc >1.6x106 A{center_dot}cm-2 at 77 K in self-field on a SRO-buffered YBCO film grown with ISD-MgO architecture.},
doi = {10.1063/1.2192418},
journal = {AIP Conference Proceedings},
number = 1,
volume = 824,
place = {United States},
year = {Fri Mar 31 00:00:00 EST 2006},
month = {Fri Mar 31 00:00:00 EST 2006}
}