skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: A New Multi-Gaussian Auto-Correlation Function for the Modeling of Realistic Shot Peened Random Rough Surfaces

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.2184687· OSTI ID:20798231
 [1];  [2]
  1. Honeywell Aerospace, 111 S. 34th Street, M/S 503-118 Phoenix, AZ 85034 (United States)
  2. Air Force Research Laboratory (AFRL/MLLP), 2230 10th Street, Suite 1, Dayton, OH 45433 (United States)

Shot peening is the primary surface treatment used to create a uniform, consistent, and reliable sub-surface compressive residual stress layer in aero engine components. A by-product of the shot peening process is random surface roughness that can affect the measurements of the resulting residual stresses and therefore impede their NDE assessment. High frequency eddy current conductivity measurements have the potential to assess these residual stresses in Ni-base super alloys. However, the effect of random surface roughness is expected to become significant in the desired measurement frequency range of 10 to 100 MHz. In this paper, a new Multi-Gaussian (MG) auto-correlation function is proposed for modeling the resulting pseudo-random rough profiles. Its use in the calculation of the Apparent Eddy Current Conductivity (AECC) loss due to surface roughness is demonstrated. The numerical results presented need to be validated with experimental measurements.

OSTI ID:
20798231
Journal Information:
AIP Conference Proceedings, Vol. 820, Issue 1; Conference: Conference on review of progress in quantitative nondestructive evaluation, Brunswick, ME (United States), 31 Jul - 5 Aug 2005; Other Information: DOI: 10.1063/1.2184687; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English