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Title: The Influence of Stark Shift and Plasma Inhomogeneity on Halfwidth of Self-absorbed Line Profiles in Plasma Emission Spectrum

Abstract

The dependence of line halfwidth on plasma inhomogeneity and Stark broadening and shift parameters has been investigated by the numerical simulation. It is shown that the increasing of the ratio of Stark shift parameter to Stark width one lowers the inhomogeneity influence on the line profile. When the Stark shift parameter is comparable with Stark width one the function of line halfwidth on plasma optical thickness is the same for the homogeneous plasma and inhomogeneous plasma. It is shown that in case of optical thickness is more than two the function can be expressed by product of function for homogeneous plasma and a factor, which depends on plasma inhomogeneity mainly. The obtained results can be used for plasma optical thickness determining without a using a supplementary light source to scan the plasma.

Authors:
;  [1]
  1. Institute of Molecular and Atomic Physics, National Academy of Sciences, 70 Nezavisimosti Ave., 220072, Minsk (Belarus)
Publication Date:
OSTI Identifier:
20797948
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 812; Journal Issue: 1; Conference: PLASMA 2005: International conference on research and applications of plasmas; 3. German-Polish conference on plasma diagnostics for fusion and applications; 5. French-Polish seminar on thermal plasma in space and laboratory, Opole-Turawa (Poland), 6-9 Sep 2005; Other Information: DOI: 10.1063/1.2168875; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; COMPUTERIZED SIMULATION; EMISSION SPECTRA; HOMOGENEOUS PLASMA; INHOMOGENEOUS PLASMA; LINE BROADENING; PLASMA DIAGNOSTICS; PLASMA SIMULATION; SPECTRAL SHIFT; STARK EFFECT; THICKNESS

Citation Formats

Catsalap, K. Yu., and Ershov-Pavlov, E. A.. The Influence of Stark Shift and Plasma Inhomogeneity on Halfwidth of Self-absorbed Line Profiles in Plasma Emission Spectrum. United States: N. p., 2006. Web. doi:10.1063/1.2168875.
Catsalap, K. Yu., & Ershov-Pavlov, E. A.. The Influence of Stark Shift and Plasma Inhomogeneity on Halfwidth of Self-absorbed Line Profiles in Plasma Emission Spectrum. United States. doi:10.1063/1.2168875.
Catsalap, K. Yu., and Ershov-Pavlov, E. A.. Sun . "The Influence of Stark Shift and Plasma Inhomogeneity on Halfwidth of Self-absorbed Line Profiles in Plasma Emission Spectrum". United States. doi:10.1063/1.2168875.
@article{osti_20797948,
title = {The Influence of Stark Shift and Plasma Inhomogeneity on Halfwidth of Self-absorbed Line Profiles in Plasma Emission Spectrum},
author = {Catsalap, K. Yu. and Ershov-Pavlov, E. A.},
abstractNote = {The dependence of line halfwidth on plasma inhomogeneity and Stark broadening and shift parameters has been investigated by the numerical simulation. It is shown that the increasing of the ratio of Stark shift parameter to Stark width one lowers the inhomogeneity influence on the line profile. When the Stark shift parameter is comparable with Stark width one the function of line halfwidth on plasma optical thickness is the same for the homogeneous plasma and inhomogeneous plasma. It is shown that in case of optical thickness is more than two the function can be expressed by product of function for homogeneous plasma and a factor, which depends on plasma inhomogeneity mainly. The obtained results can be used for plasma optical thickness determining without a using a supplementary light source to scan the plasma.},
doi = {10.1063/1.2168875},
journal = {AIP Conference Proceedings},
number = 1,
volume = 812,
place = {United States},
year = {Sun Jan 15 00:00:00 EST 2006},
month = {Sun Jan 15 00:00:00 EST 2006}
}