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Title: Structural and magnetic properties of epitaxially grown full-Heusler alloy Co{sub 2}MnGe thin films deposited using magnetron sputtering

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.2170980· OSTI ID:20788136
; ; ; ; ;  [1]
  1. Division of Electronics for Informatics, Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814 (Japan)

Full-Heusler alloy Co{sub 2}MnGe thin films were epitaxially grown on MgO (001) substrates using magnetron sputtering. The films were deposited at room temperature and subsequently annealed in situ at temperatures ranging from 400 to 600 deg. C. X-ray pole figure measurements for the annealed films showed (111) peaks with fourfold symmetry, which gives direct evidence that these films are epitaxial and crystallized in the L2{sub 1} structure. Furthermore, cross-sectional transmission electron microscope images of a fabricated film indicated that it is single crystalline. The annealed films had sufficiently flat surface morphologies with roughnesses of about 0.26 nm rms at film thicknesses of 45 nm. The saturation magnetization of the annealed films was 4.49 {mu}{sub B}/f.u. at 10 K, corresponding to about 90% of the Slater-Pauling value for Co{sub 2}MnGe.

OSTI ID:
20788136
Journal Information:
Journal of Applied Physics, Vol. 99, Issue 8; Other Information: DOI: 10.1063/1.2170980; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English