Measurement of the separation between atoms beyond diffraction limit
Abstract
Precision measurement of small separations between two atoms or molecules has been of interest since the early days of science. Here, we discuss a scheme which yields spatial information on a system of two identical atoms placed in a standing wave laser field. The information is extracted from the collective resonance fluorescence spectrum, relying entirely on far-field imaging techniques. Both the interatomic separation and the positions of the two particles can be measured with fractional-wavelength precision over a wide range of distances from about {lambda}/550 to {lambda}/2.
- Authors:
- Institute for Quantum Studies and Department of Physics, Texas A and M University, College Station, Texas 77843-4242 (United States)
- (Germany)
- (United States)
- Publication Date:
- OSTI Identifier:
- 20786837
- Resource Type:
- Journal Article
- Resource Relation:
- Journal Name: Physical Review. A; Journal Volume: 73; Journal Issue: 3; Other Information: DOI: 10.1103/PhysRevA.73.031803; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 74 ATOMIC AND MOLECULAR PHYSICS; ACCURACY; ATOMS; DIFFRACTION; DISTANCE; EMISSION SPECTRA; LASER RADIATION; MOLECULES; RESONANCE FLUORESCENCE; STANDING WAVES; WAVELENGTHS
Citation Formats
Chang, J.-T., Suhail Zubairy, M., Evers, Joerg, Max-Planck-Institut fuer Kernphysik, Saupfercheckweg 1, D-69117 Heidelberg, Scully, Marlan O., and Princeton Institute for Materials Research, Princeton University, Princeton, NJ 08544-1009. Measurement of the separation between atoms beyond diffraction limit. United States: N. p., 2006.
Web. doi:10.1103/PHYSREVA.73.0.
Chang, J.-T., Suhail Zubairy, M., Evers, Joerg, Max-Planck-Institut fuer Kernphysik, Saupfercheckweg 1, D-69117 Heidelberg, Scully, Marlan O., & Princeton Institute for Materials Research, Princeton University, Princeton, NJ 08544-1009. Measurement of the separation between atoms beyond diffraction limit. United States. doi:10.1103/PHYSREVA.73.0.
Chang, J.-T., Suhail Zubairy, M., Evers, Joerg, Max-Planck-Institut fuer Kernphysik, Saupfercheckweg 1, D-69117 Heidelberg, Scully, Marlan O., and Princeton Institute for Materials Research, Princeton University, Princeton, NJ 08544-1009. Wed .
"Measurement of the separation between atoms beyond diffraction limit". United States.
doi:10.1103/PHYSREVA.73.0.
@article{osti_20786837,
title = {Measurement of the separation between atoms beyond diffraction limit},
author = {Chang, J.-T. and Suhail Zubairy, M. and Evers, Joerg and Max-Planck-Institut fuer Kernphysik, Saupfercheckweg 1, D-69117 Heidelberg and Scully, Marlan O. and Princeton Institute for Materials Research, Princeton University, Princeton, NJ 08544-1009},
abstractNote = {Precision measurement of small separations between two atoms or molecules has been of interest since the early days of science. Here, we discuss a scheme which yields spatial information on a system of two identical atoms placed in a standing wave laser field. The information is extracted from the collective resonance fluorescence spectrum, relying entirely on far-field imaging techniques. Both the interatomic separation and the positions of the two particles can be measured with fractional-wavelength precision over a wide range of distances from about {lambda}/550 to {lambda}/2.},
doi = {10.1103/PHYSREVA.73.0},
journal = {Physical Review. A},
number = 3,
volume = 73,
place = {United States},
year = {Wed Mar 15 00:00:00 EST 2006},
month = {Wed Mar 15 00:00:00 EST 2006}
}
Other availability
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
-
-
Correlated Topographic and Spectroscopic Imaging Beyond Diffraction Limit by Atomic Force Microscopy Metallic Tip-Enhanced Near-Field Fluorescence Lifetime Microscopy
A new approach is demonstrated for simultaneous topographic and spectroscopic imaging applying near-field optics (NSOM) with spatial resolution beyond the optical diffraction-limit. The method combines atomic force microscopy (AFM) in the metallic-tip tapping mode and near-field scanning confocal fluorescence lifetime imaging microscopy (FILM). The AFM metallic tip was formed by sputter-coating a Si tapping mode tip with Au to form a spherulitic shape at the tip apex, allowing a high local field enhancement under laser illumination, which was necessary for a strong optical signal. A simulation used to finite element method (FEM) to further evaluate the near-field enhancement originating frommore » -
Optical storage of high-density information beyond the diffraction limit: A quantum study
We propose an optical readout scheme allowing a proof of principle of information extraction below the diffraction limit. This technique, which could lead to improvement in data readout density onto optical disks, is independent from the wavelength and numerical aperture of the reading apparatus, and involves a multipixel array detector. Furthermore, we show how to use nonclassical light in order to perform a bit discrimination beyond the quantum noise limit.