Synthesis and ferroelectric properties of epitaxial BiFeO{sub 3} thin films grown by sputtering

Journal Article · Mon Jun 12 00:00:00 EDT 2006 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2213347· OSTI ID:20779406

Das, R R; Kim, D M; Baek, S H; Eom, C B; Zavaliche, F; Yang, S Y; Ramesh, R; Chen, Y B; Pan, X Q; Ke, X; Rzchowski, M S; Streiffer, S K ^[1]

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1. Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706 (United States)

We have grown epitaxial BiFeO{sub 3} thin films with smooth surfaces on (001) (101), and (111) SrTiO{sub 3} substrates using sputtering. Four-circle x-ray diffraction and cross-sectional transmission electron microscopy show that the BiFeO{sub 3} thin films have rhombohedral symmetry although small monoclinic distortions have not been ruled out. Stripe ferroelectric domains oriented perpendicular to the substrate miscut direction and free of impurity phase are observed in BiFeO{sub 3} on high miscut (4 deg.) (001) SrTiO{sub 3}, which attributes to a relatively high value of remanent polarization ({approx}71 {mu}C/cm{sup 2}). Films grown on low miscut (0.8 deg.) SrTiO{sub 3} have a small amount of impure phase {alpha}-Fe{sub 2}O{sub 3} which contributes to lower the polarization values ({approx}63 {mu}C/cm{sup 2}). The BiFeO{sub 3} films grown on (101) and (111) SrTiO{sub 3} exhibited remanent polarizations of 86 and 98 {mu}C/cm{sup 2}, respectively.

• OSTI ID: 20779406
• Journal Information: Applied Physics Letters, Vol. 88, Issue 24; Other Information: DOI: 10.1063/1.2213347; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BISMUTH COMPOUNDS
DEPOSITION
EPITAXY
FERROELECTRIC MATERIALS
IRON OXIDES
MONOCLINIC LATTICES
POLARIZATION
SPUTTERING
STRONTIUM TITANATES
SUBSTRATES
SYNTHESIS
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION