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Title: Cryogenic low energy electron point source microscope

Abstract

The design and performance of a cryogenic low energy electron point source microscope are described. The microscope can be immersed in liquid helium, thus allowing for investigations at cryogenic temperatures. The cryogenic environment is associated with a low fluctuation in the field emission electron beam current and, combined with a compact and rigid mechanical design, low mechanical drift characteristics.

Authors:
;  [1]
  1. Institute of Physics, University of Zurich, Winterthurerstrasse 190, Zurich CH-8057 (Switzerland)
Publication Date:
OSTI Identifier:
20779203
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 77; Journal Issue: 4; Other Information: DOI: 10.1063/1.2195120; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BEAM CURRENTS; CRYOGENICS; DESIGN; ELECTRON BEAMS; ELECTRON MICROSCOPES; ELECTRONS; FIELD EMISSION; FLUCTUATIONS; HELIUM; LIQUIDS; PERFORMANCE; POINT SOURCES

Citation Formats

Okamoto, Hiroshi, and Fink, Hans-Werner. Cryogenic low energy electron point source microscope. United States: N. p., 2006. Web. doi:10.1063/1.2195120.
Okamoto, Hiroshi, & Fink, Hans-Werner. Cryogenic low energy electron point source microscope. United States. doi:10.1063/1.2195120.
Okamoto, Hiroshi, and Fink, Hans-Werner. Sat . "Cryogenic low energy electron point source microscope". United States. doi:10.1063/1.2195120.
@article{osti_20779203,
title = {Cryogenic low energy electron point source microscope},
author = {Okamoto, Hiroshi and Fink, Hans-Werner},
abstractNote = {The design and performance of a cryogenic low energy electron point source microscope are described. The microscope can be immersed in liquid helium, thus allowing for investigations at cryogenic temperatures. The cryogenic environment is associated with a low fluctuation in the field emission electron beam current and, combined with a compact and rigid mechanical design, low mechanical drift characteristics.},
doi = {10.1063/1.2195120},
journal = {Review of Scientific Instruments},
number = 4,
volume = 77,
place = {United States},
year = {Sat Apr 15 00:00:00 EDT 2006},
month = {Sat Apr 15 00:00:00 EDT 2006}
}