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Title: Effect of Te precipitates on the performance of CdZnTe detectors

Abstract

Measurements using the National Synchrotron Light Source provided a detailed comparisons of the microscale detector response and infrared microscopy images for CdZnTe Frisch-ring x-ray and gamma detectors. Analysis of the data showed conclusively that local deteriorations of the electron charge collection and x-ray device response fully correlate with the presence of Te precipitates as seen in the IR images. Effects of the surface processing conditions on the detector performance were also clearly observed.

Authors:
; ; ; ; ;  [1];  [2]
  1. Department of Nonproliferation and National Security, Brookhaven National Laboratory, Upton, New York 11973-5000 (United States)
  2. (United States)
Publication Date:
OSTI Identifier:
20779170
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 88; Journal Issue: 14; Other Information: DOI: 10.1063/1.2189912; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CADMIUM TELLURIDES; CHARGE COLLECTION; ELECTRONS; GAMMA DETECTION; IMAGES; MICROSCOPY; NSLS; PERFORMANCE; PRECIPITATION; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS; SURFACE TREATMENTS; TELLURIUM; X-RAY DETECTION; ZINC TELLURIDES

Citation Formats

Carini, G.A., Bolotnikov, A.E., Camarda, G.S., Wright, G.W., James, R.B., Li, L., and Yinnel Tech, Inc., South Bend, Indiana 46619. Effect of Te precipitates on the performance of CdZnTe detectors. United States: N. p., 2006. Web. doi:10.1063/1.2189912.
Carini, G.A., Bolotnikov, A.E., Camarda, G.S., Wright, G.W., James, R.B., Li, L., & Yinnel Tech, Inc., South Bend, Indiana 46619. Effect of Te precipitates on the performance of CdZnTe detectors. United States. doi:10.1063/1.2189912.
Carini, G.A., Bolotnikov, A.E., Camarda, G.S., Wright, G.W., James, R.B., Li, L., and Yinnel Tech, Inc., South Bend, Indiana 46619. Mon . "Effect of Te precipitates on the performance of CdZnTe detectors". United States. doi:10.1063/1.2189912.
@article{osti_20779170,
title = {Effect of Te precipitates on the performance of CdZnTe detectors},
author = {Carini, G.A. and Bolotnikov, A.E. and Camarda, G.S. and Wright, G.W. and James, R.B. and Li, L. and Yinnel Tech, Inc., South Bend, Indiana 46619},
abstractNote = {Measurements using the National Synchrotron Light Source provided a detailed comparisons of the microscale detector response and infrared microscopy images for CdZnTe Frisch-ring x-ray and gamma detectors. Analysis of the data showed conclusively that local deteriorations of the electron charge collection and x-ray device response fully correlate with the presence of Te precipitates as seen in the IR images. Effects of the surface processing conditions on the detector performance were also clearly observed.},
doi = {10.1063/1.2189912},
journal = {Applied Physics Letters},
number = 14,
volume = 88,
place = {United States},
year = {Mon Apr 03 00:00:00 EDT 2006},
month = {Mon Apr 03 00:00:00 EDT 2006}
}