Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source

Cao, Y; Sun, L T; Ma, L; Ma, B H; Wang, H; Feng, Y C; Li, J Y; Zhao, H W; Zhang, Z M; Zhang, X Z; He, W; Zhao, H Y; Guo, X; Li, X X

doi:10.1063/1.2172357

Title: Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source

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Abstract

With a latest developed electric-sweep scanner system, we have done a lot of experiments for studying this scanner system and ion beam emittance of electron cyclotron resonance (ECR) ion source. The electric-sweep scanner system was installed on the beam line of Lanzhou electron resonance ion source No. 3 experimental platform of Institute of Modern Physics. The repetition experiments have proven that the system is a relatively dependable and reliable emittance scanner, and its experiment error is about 10%. We have studied the influences of the major parameters of ECR ion source on the extracted ion beam emittance. The typical results of the experiments and the conclusions are presented in this article.

Authors:

Cao, Y; Sun, L T; Ma, L; Ma, B H; Wang, H; Feng, Y C; Li, J Y; Zhao, H W; Zhang, Z M; Zhang, X Z; He, W; Zhao, H Y; Guo, X; Li, X X ^[1]

Institute of Modern Physics (IMP), Chinese Academy of Sciences, Lanzhou, Gansuo 730000 (China)

Publication Date:: Wed Mar 15 00:00:00 EST 2006

OSTI Identifier:: 20778986

Resource Type:: Journal Article

Journal Name:: Review of Scientific Instruments

Additional Journal Information:: Journal Volume: 77; Journal Issue: 3; Conference: 11. international conference on ion sources, Caen (France), 12-16 Sep 2005; Other Information: DOI: 10.1063/1.2172357; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748

Country of Publication:: United States

Language:: English

Subject:: 43 PARTICLE ACCELERATORS; BEAM EXTRACTION; ECR ION SOURCES; ELECTRON CYCLOTRON-RESONANCE; ION BEAMS; PARTICLE BEAMS

Citation Formats


                    Cao, Y, Sun, L T, Ma, L, Ma, B H, Wang, H, Feng, Y C, Li, J Y, Zhao, H W, Zhang, Z M, Zhang, X Z, He, W, Zhao, H Y, Guo, X, and Li, X X. Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source.  United States: N. p., 2006. 
        Web.  doi:10.1063/1.2172357.

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                    Cao, Y, Sun, L T, Ma, L, Ma, B H, Wang, H, Feng, Y C, Li, J Y, Zhao, H W, Zhang, Z M, Zhang, X Z, He, W, Zhao, H Y, Guo, X, & Li, X X. Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source.  United States.  https://doi.org/10.1063/1.2172357

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                    Cao, Y, Sun, L T, Ma, L, Ma, B H, Wang, H, Feng, Y C, Li, J Y, Zhao, H W, Zhang, Z M, Zhang, X Z, He, W, Zhao, H Y, Guo, X, and Li, X X. 2006.  
        "Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source".  United States.  https://doi.org/10.1063/1.2172357.

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@article{osti_20778986,

  title        = {Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source},

  author       = {Cao, Y and Sun, L T and Ma, L and Ma, B H and Wang, H and Feng, Y C and Li, J Y and Zhao, H W and Zhang, Z M and Zhang, X Z and He, W and Zhao, H Y and Guo, X and Li, X X},

  abstractNote = {With a latest developed electric-sweep scanner system, we have done a lot of experiments for studying this scanner system and ion beam emittance of electron cyclotron resonance (ECR) ion source. The electric-sweep scanner system was installed on the beam line of Lanzhou electron resonance ion source No. 3 experimental platform of Institute of Modern Physics. The repetition experiments have proven that the system is a relatively dependable and reliable emittance scanner, and its experiment error is about 10%. We have studied the influences of the major parameters of ECR ion source on the extracted ion beam emittance. The typical results of the experiments and the conclusions are presented in this article.},

  doi          = {10.1063/1.2172357},

  url          = {https://www.osti.gov/biblio/20778986},
  journal      = {Review of Scientific Instruments},

  issn         = {0034-6748},

  number       = 3,

  volume       = 77,

  place        = {United States},

  year         = {Wed Mar 15 00:00:00 EST 2006},

  month        = {Wed Mar 15 00:00:00 EST 2006}

}

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