Local Structure of a Rolled-Up Single Crystal: An X-Ray Microdiffraction Study of Individual Semiconductor Nanotubes

Journal Article · Fri Apr 28 00:00:00 EDT 2006 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.96.165502· OSTI ID:20777171

Krause, B; Mocuta, C; Metzger, T H; Deneke, Ch; Schmidt, O G ^[1]

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1. European Synchrotron Radiation Facility, Boite Postale 220, F-38043 Grenoble Cedex (France)

Crystals with cylindrical symmetry, not existing in nature, are mimicked by the roll-up of single-crystalline and highly strained semiconductor bilayers. Exploiting this, the local structure of such individual rolled-up nanotubes is locally probed and quantified nondestructively by x-ray microbeam diffraction. A comparison to simulations, based on the minimization of the elastic energy, allows us to determine layer thicknesses and lattice parameter distributions within the strongly curved bilayers.

• OSTI ID: 20777171
• Journal Information: Physical Review Letters, Vol. 96, Issue 16; Other Information: DOI: 10.1103/PhysRevLett.96.165502; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COMPARATIVE EVALUATIONS
CYLINDRICAL CONFIGURATION
LATTICE PARAMETERS
MINIMIZATION
MONOCRYSTALS
NANOTUBES
SEMICONDUCTOR MATERIALS
SIMULATION
SYMMETRY
THICKNESS
X-RAY DIFFRACTION