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Title: Atomic data and spectral line intensities for Mg V

Journal Article · · Atomic Data and Nuclear Data Tables
 [1];  [2];  [3]
  1. NASA/Goddard Space Flight Center, Greenbelt, MD 20771 (United States)
  2. ARTEP, Inc. at Naval Research Laboratory, Washington, DC 20375 (United States)
  3. Institut fuer Theoretische Physik, Teilinstitut 1, Pfaffenwaldring 57/4, D-70550 Stuttgart (Germany)

Electron impact collision strengths, energy levels, oscillator strengths, and spontaneous radiative decay rates are calculated for Mg V. The configurations used are 2s{sup 2}2p{sup 4}, 2s2p{sup 5}, 2p{sup 6}, 2s{sup 2}2p{sup 3}3s, 2s{sup 2}2p{sup 3}3p, and 2s{sup 2}2p{sup 3}3d, giving rise to 86 fine-structure levels in intermediate coupling. Collision strengths are calculated at five incident energies, 10, 20, 30, 40, and 50 Ry, in the distorted wave approximation. Excitation rate coefficients (not tabulated here) are calculated as a function of electron temperature by assuming a Maxwellian electron velocity distribution. To calculate excitation rate coefficients, collision strengths at low and high energy limits are calculated by a method described by Burgess and Tully. Using the excitation rate coefficients and the radiative transition rates, statistical equilibrium equations for level populations are solved at electron densities covering the range of 10{sup 8}-10{sup 14} cm{sup -3} at an electron temperature of log T {sub e} = 5.4, corresponding to the maximum abundance of Mg V. Fractional level populations and relative spectral line intensities are also calculated. Our calculated intensities are compared with the active region observations from the solar EUV rocket telescope and spectrograph (SERTS) and the diagnostic properties of Mg V are discussed. This dataset will be made available in the next version of the CHIANTI database.

OSTI ID:
20761891
Journal Information:
Atomic Data and Nuclear Data Tables, Vol. 92, Issue 1; Other Information: DOI: 10.1016/j.adt.2005.09.002; PII: S0092-640X(05)00054-9; Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0092-640X
Country of Publication:
United States
Language:
English

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