Backscattered electron microscopy technique enhancing stretch zone width imaging for initiation fracture toughness measurements

Journal Article · Wed Oct 15 00:00:00 EDT 2003 · Materials Characterization

DOI:https://doi.org/10.1016/j.matchar.2003.10.009· OSTI ID:20748719

Tarpani, J R; Bose, W W; Spinelli, D

Backscattered and secondary electron microscopy techniques have been compared in determining critical stretch zone widths (SZW{sub C}) formed in the original and thermally embrittled microstructures of a nuclear reactor pressure vessel steel tested under Charpy impact loading conditions. It has been shown that the former technique does improve fracture surface image quality, as compared to the widely used secondary electron imaging mode, and so accurate measurements of initiation fracture toughness have been achieved over the whole range of mechanical behavior studied. Hence, a Hall-Petch dependence of the SZW{sub C} on the representative cell size of the materials tested could be identified.

• OSTI ID: 20748719
• Journal Information: Materials Characterization, Vol. 51, Issue 2-3; Other Information: DOI: 10.1016/j.matchar.2003.10.009; PII: S1044580303001980; Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ELECTRON MICROSCOPY
EMBRITTLEMENT
FRACTOGRAPHY
FRACTURE PROPERTIES
FRACTURES
IMPACT TESTS
LOADING
MICROSTRUCTURE
PRESSURE VESSELS
REACTORS
STEELS
SURFACES
WIDTH
ZONES