Diode calibration of a Langmuir probe system for measurement of electron energy distribution functions in a plasma

Journal Article · Mon Aug 15 00:00:00 EDT 2005 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2006287· OSTI ID:20723109

DeJoseph, Jr, C A; Demidov, V I ^[1]

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1. Air Force Research Laboratory, Wright-Patterson AFB, Dayton, Ohio 45433 (United States)

It is shown that a simple circuit consisting of a semiconductor diode, a resistor, and a dc voltage source can model a narrow-energy group of electrons in a plasma for the purpose of calibration of a Langmuir probe. The calibration is appropriate when the probe is used for measurement of the electron energy distribution function (EEDF). This simple circuit allows real-time determination of sensitivity, energy resolution, and signal-to-noise ratio for probe measurements of the EEDF.

• OSTI ID: 20723109
• Journal Information: Review of Scientific Instruments, Vol. 76, Issue 8; Other Information: DOI: 10.1063/1.2006287; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CALIBRATION
ELECTRIC POTENTIAL
ELECTRONS
ENERGY RESOLUTION
ENERGY SPECTRA
LANGMUIR PROBE
PLASMA
RESISTORS
SEMICONDUCTOR DIODES
SENSITIVITY
SIGNAL-TO-NOISE RATIO
THERMIONIC DIODES