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Title: Effects of hydrogenation on the local structure of In{sub x}Ga{sub 1-x}As{sub 1-y}N{sub y} quantum wells and GaAs{sub 1-y}N{sub y} epilayers

Journal Article · · Physical Review. B, Condensed Matter and Materials Physics
 [1];  [2];  [3]; ;  [4];  [5];  [6]
  1. European Synchrotron Radiation Facility, Boite Postale 220, 38043 Grenoble Cedex 9 (France)
  2. Commissariat a l'Energie Atomique, Departement de Recherche Fondamentale sur la Matiere Condensee, SP2M/NRS, 17 Avenue des Martyrs, 38054 Grenoble Cedex 9 (France)
  3. Departamento de Fisica de la Materia Condensada, Instituto de Ciencia de Materiales de Aragon, CSIC-Universidad de Zaragoza, calle Pedro Cerbuna 12, 50009 Zaragoza (Spain)
  4. INFM and Department of Physics, University of Roma 'La Sapienza', P.le A. Moro 2, 00185 Rome (Italy)
  5. Department of Physics, University of Roma III, Via della Vasca Navale 84, 00146 Rome (Italy)
  6. Department of Physics and CNR-INFM, University of Bologna, V.le C. Berti Pichat 6/2, 40127 Bologna (Italy)

We address in this paper the issue of the effects of hydrogenation on the local structure of In{sub x}Ga{sub 1-x}As{sub 1-y}N{sub y} quantum wells by combining In K-edge x-ray absorption and Ga K-edge x-ray diffraction anomalous fine structure experiments. We found that the cation-As bond lengths in hydrogenated samples are systematically longer than the values predicted by a valence force field model corrected for the epitaxial strain. We interpret this bond lengths stretching as a local effect of the formation of N-H complexes very recently predicted by theoretical calculations. By analyzing the Debye-Waller factor of the Ga-As bond length distribution, we observed that hydrogenation removes the static disorder induced by N incorporation in GaAs; this effect is due to the unique characteristics of the N substitutional anion and to the breaking of the ionic Ga-N bonds upon hydrogenation.

OSTI ID:
20719358
Journal Information:
Physical Review. B, Condensed Matter and Materials Physics, Vol. 72, Issue 8; Other Information: DOI: 10.1103/PhysRevB.72.085322; (c) 2005 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
Country of Publication:
United States
Language:
English